Search result: Catalogue data in Spring Semester 2018

Materials Science Master Information
Core Courses
NumberTitleTypeECTSHoursLecturers
327-1206-00LSoft Materials IW Dr5 credits4GJ. Vermant, A. D. Schlüter
AbstractPart 1 of the course (Spring semester) focuses on the chemistry of the building blocks and to learn how structures can be manipulated by chemistry, composition and phase behaviour. The goal is to learn what can be done, both in an idealized research environment and in the realm of industrial scale production.
Learning objectiveThe goal of the two courses combined is to present the students with a toolbox for materials engineers to design, study and make soft materials.
ContentWhere physics, chemistry and biology meet engineering.
Lecture notesCopies of the slides and a set of lecture notes will be provided.
LiteratureFor the first and the second part combined there are a few books of recommended reading, but their is no textbook that we will rigorously follow.

Introduction to Soft Matter: Synthetic and Biological Self-Assembling Materials Paperback by Ian W. Hamley
ISBN-13: 978-0470516102 ISBN-10: 0470516100

Structured Fluids: Polymers, Colloids, Surfactants
by Thomas A. Witten, Philip A. Pincus (OXford)
ISBN-13: 978-0199583829 ISBN-10: 019958382X
327-2201-00LTransport Phenomena II Information W Dr5 credits4GH. C. Öttinger
AbstractNumerical methods for real-world "Transport Phenomena"; atomistic understanding of transport properties based on kinetic theory and mesoscopic models; fundamentals, applications, and simulations
Learning objectiveThe teaching goals of this course are on five different levels:
(1) Deep understanding of fundamentals: kinetic theory, mesoscopic models, ...
(2) Ability to use the fundamental concepts in applications
(3) Insight into the role of boundary conditions
(4) Knowledge of a number of applications
(5) Flavor of numerical techniques: finite elements, lattice Boltzmann, ...
ContentThermodynamics of Interfaces
Interfacial Balance Equations
Interfacial Force-Flux Relations
Polymer Processing
Transport Around a Sphere
Refreshing Topics in Equilibrium Statistical Mechanics
Kinetic Theory of Gases
Kinetic Theory of Polymeric Liquids
Transport in Biological Systems
Dynamic Light Scattering
Lecture notesA detailed manuscript is available; this manuscript will be developed into a book entitled "A Modern Course in Transport Phenomena" by David C. Venerus and Hans Christian Öttinger
Literature1. R. B. Bird, W. E. Stewart, and E. N. Lightfoot, Transport Phenomena, 2nd Ed. (Wiley, 2001)
2. S. R. de Groot and P. Mazur, Non-Equilibrium Thermodynamics, 2nd Ed. (Dover, 1984)
3. R. B. Bird, Five Decades of Transport Phenomena (Review Article), AIChE J. 50 (2004) 273-287
4. R. Phillips, J. Kondev, and J. Theriot, Physical Biology of the Cell (Garland, 2008)
5. G. A. Truskey, F. Yuan, and D. F. Katz, Transport Phenomena in Biological Systems (Prentice Hall, 2004)
Prerequisites / NoticeComplex numbers. Vector analysis (integrability; Gauss' divergence theorem). Laplace and Fourier transforms. Ordinary differential equations (basic ideas). Linear algebra (matrices; functions of matrices; eigenvectors and eigenvalues; eigenfunctions). Probability theory (Gaussian distributions; Poisson distributions; averages; moments; variances; random variables). Numerical mathematics (integration). Statistical thermodynamics (Gibbs' fundamental equation; thermodynamic potentials; Legendre transforms; Gibbs' phase rule; ergodicity; partition functions; Einstein's fluctuation theory). Linear irreversible thermodynamics (forces and fluxes; Fourier's, Newton's and Fick's laws for fluxes). Hydrodynamics (local equilibrium; balance equations for mass, momentum, energy and entropy). Programming and simulation techniques (Matlab, Monte Carlo simulations).
327-2202-00LSize Effects in Materials
Either 327-2207-00L Solid State Physics and Chemistry of Materials II or 327-2202-00L Size Effects in Materials can be counted as core course. The other will be counted as elective course.
W Dr4 credits4GR. Spolenak
AbstractThe core of this course explains how the behavior of materials changes, when their external dimensions become small (usually on the micro- to nanometer length scale) until quantum effects become dominant. This is illustrated by examples from all materials classes and further substantiated by case studies of applications ranging from micro- and nanoelectronics to optoelectronics.
Learning objectiveTeaching goals:

to learn which materials are used in electronics, microelectronics and optoelectronics and why

to understand how materials properties change when their external dimensions approach the micro- and nanoscale

to grasp the materials and processing issues involved in miniaturized electronic, mechanical and optical systems

to be exposed to state of the art technologies for fabrication and characterization of such systems
ContentThe core of the course is the materials behavior in small dimensions. Focus will be put on scaling of electronic and mechanical properties, thin film mechanics, device reliability and integration issues when dissimilar materials are joined. Advanced characterization techniques specific to microcomponents will be presented. Finally possible future solutions to further miniaturization, such as carbon nanotubes or 3D integration molecular electronics, will be critically discussed. Excursions to microelectronic companies are part of the course.

Topics include:

Basics
Scaling laws and size effects
Energy scales in materials science
Length scales in materials science
Size-dependent color effects
Mechanical properties
Electronic properties
Measuring properties
Applications:
Fabrication of microcomponents
Materials for Microelectronics and MEMS/NEMS
Materials for Transistors
Quantum dots
Novel materials for optical telecommunication, optical information processing, optical data storage and data display
Lecture notesPlease visit the Moodle-link for this lecture
Literature"Thin Film Materials: Stress, Surface Evolution and Failure", L. B. Freund and S. Suresh, Cambridge University Press, 2003.

"Metal Based Thin Films for Electronics", K. Wetzig and C. M. Schneider (Eds.), Wiley-VCH, 2003

More literature will be announced in class.
Prerequisites / NoticeExcursion to IBM Laboratories, Rüschlikon

Prerequisites: Good understanding of materials science, equivalent to the Bachelor Degree in Materials Science at ETH Zurich
327-2203-00LComplex Materials II: Structure & PropertiesW Dr5 credits4GJ. F. Löffler, M. Fiebig
AbstractThe course presents structure-property relationships in complex materials, such as photonic or ferroic crystals, heterostructures, and disordered materials.
Learning objectiveThe aim of the course is to impart detailed knowledge of the structure-property relationships in complex materials, such as photonic or ferroic crystals, heterostructures, and disordered materials.
ContentPart 1 focuses on the synthesis and processing of amorphous materials using physical routes. The resulting structure is discussed, as well as their thermodynamics and kinetics. The course focuses in particular on the relationships between the structure of glassy metals and other disordered materials and their resulting mechanical, thermophysical, biomedical and electronic properties. As to processing, new manufacturing routes such as 3D printing of metals are also introduced.

In part 2, single crystals and heterostructures will be investigated for unconventional manifestations of ferroic order, such as (anti-) ferromagnetism, ferroelectricity, ferrotoroidicity and in particular the coexistence of two or more of these. Domains and their interaction are of particular interest. They are visualized by laser-optical and force microscopy techniques. Very often the (multi-)ferroic order is a consequence of the competing interactions between spins, charges, orbitals, and lattices. This interplay is resolved by ultrafast laser spectroscopy with access to the sub-picosecond timescale.
Lecture noteshttp://www.metphys.mat.ethz.ch/education/lectures/complex-materials-ii.html
LiteratureReferences to original articles and reviews for further reading will be provided.
Prerequisites / NoticeKnowledge in the physics of materials, as provided by the ETH Zurich B.S. curriculum in Materials Science.
327-2204-00LMaterials at Work IIW Dr4 credits4SR. Spolenak, D. Hegemann, A. R. Studart
AbstractThis course attempts to prepare the student for a job as a materials engineer in industry. The gap between fundamental materials science and the materials engineering of products should be bridged. The focus lies on the practical application of fundamental knowledge allowing the students to experience application related materials concepts with a strong emphasis on case-study mediated learning.
Learning objectiveTeaching goals:

to learn how materials are selected for a specific application

to understand how materials around us are produced and manufactured

to understand the value chain from raw material (feedstock, ores,...) to application

to be exposed to state of the art technologies for processing, joining and shaping

to be exposed to industry related materials issues and the corresponding language (terminology) and skills

to create an impression of how a job in industry "works", to improve the perception of the demands of a job in industry
ContentThe general outline for Materials at work is:

Strategic Materials (where do raw materials come from, who owns them, who owns the IP and can they be substituted)
Materials Selection (what is the optimal material (class) for a specific application)
Materials systems (subdivisions include all classical materials classes)
Processing
Joining (assembly)
Shaping
Materials and process scaling (from nm to m and vice versa, from mg to tons)
Sustainable materials manufacturing (cradle to cradle) Recycling (Energy recovery)
Materials testing

Materials at Work I focusses on Materials Selection, Polymers and Metals

Materials at Work II focusses on Metal processing, Ceramics and Surfaces
Lecture notesPlease use the Moodle-link
LiteratureManufacturing, Engineering & Technology
Serope Kalpakjian, Steven Schmid
ISBN: 978-0131489653
Prerequisites / NoticeMetals 1,2
Polymers 1,2
Ceramics 1,2
Materials at Work I
327-2205-00LSurfaces, Interfaces and their Applications IIW Dr3 credits3GP. Schmutz
AbstractIntroduction to fundamental aspects of degradation induced on materials by (electro)chemical and mechanical interactions. Surface physico-chemical processes on metal/alloys exposed to aggressive environments will be introduced. The different corrosion mechanisms and protection strategies will be presented with a description of the specific experimental methods necessary for their characterization.
Learning objectiveThe students should understand the fundamental mechanisms responsible for the most important corrosion phenomena affecting "classical" industrial relevant metals/alloys and know the limitation in the use of these "standard" materials in aggressive environments. They should also be able to transfer their corrosion mechanism knowledge directly in the developments phase of new materials/coatings in order to minimize the corrosive failure risks of new industrial products. They finally should know how to approach a corrosion problem/failure and be able to propose the right characterization technique/methodology to investigate each specific corrosion problems.
ContentThe most important types of corrosion mechanisms will be presented and discussed during the different lectures. For each specific corrosion phenomenon, the most relevant experimental characterization methods will also be introduced directly after the corrosion part. This combination allows the student to couple theoretical concepts with practical aspects of corrosion research.

Following topics will be presented:

- Thermodynamics related to corrosion reaction

- Corrosion reaction kinetics / DC electrochemical methods

- Passivation and passive film properties / XPS (X-Ray Photoelectron Spectroscopy) and EQCM (Electro-chemical Quartz Crystal Microgravimetry)

- Uniform corrosion/Electrochemical Impedance Spectroscopy (EIS)/Magnesium biocorrosion

- Galvanic corrosion/AFM-SKPFM (Scanning Kelvin Probe Force Microscopy)

- Localized corrosion (pitting)/ Microcell technique

- Photoelectrochemistry and Crevice corrosion with description of specific electrochemical setups

- Intergranular corrosion and mathematical modelling / Microtomography

- Stress corrosion cracking (SCC) / corrosion-fatigue

- Selected examples of more "exotic" corrosion mechanisms (Ag, Ta, a.s.o), corrosion protection and surface functionalizing
Lecture notesA script in English covering the lecture content is available online on the ETHZ LSST (Laboratory for Surface Science and Technology) website.

Hardcopies of the script will be distributed during the lecture.
LiteratureThe two following books cover pretty well the lecture content and offer additional and more detailed description of the phenomena/methods presented in the lecture script:

- Corrosion mechanism: D. Landolt, "Corrosion and Surface Chemistry of Metals" EPFL Press (Distributed by CRC, Taylor and Francis Group) (2007)

- Characterization methods: P. Marcus, "Analytical Methods in Corrosion Science and Engineering", CRC, Taylor and Francis Group (2006)
Prerequisites / NoticeSome background in the following fields should already be acquired by the student in order to optimally benefit from the lecture:

Chemistry:
- General undergraduate chemistry (inorganic chemistry)
including basic chemical kinetics and thermodynamics
- Electrochemical characterization

Physics:
- General undergraduate physics
- Surface analysis

Materials Science:
- Steel and Al Alloy Metallurgy
327-2207-00LSolid State Physics and Chemistry of Materials II Information
Prerequisite: Solid State Physics and Chemistry of Materials I (327-1202-00L).

Either 327-2207-00L Solid State Physics and Chemistry of Materials II or 327-2202-00L Size Effects in Materials can be counted as core course. The other will be counted as elective course.
W Dr5 credits4GN. Spaldin
AbstractContinuation of Solid State Physics and Chemistry of Materials I
Learning objectiveElectronic properties and band theory description of conventional solids
Electron-lattice coupling and its consequences in functional materials
Electron-spin/orbit coupling and its consequences in functional materials
Structure/property relationships in strongly-correlated materials
ContentIn this course we study how the properties of solids are determined from the chemistry and arrangement of the constituent atoms, with a focus on materials that are not well described by conventional band theories because their behavior is governed by strong quantum-mechanical interactions. We begin with a review of the successes of band theory in describing many properties of metals, semiconductors and insulators, and we practise building up band structures from atoms and describing the resulting properties. Then we explore classes of systems in which the coupling between the electrons and the lattice is so strong that it drives structural distortions such as Peierls instabilities, Jahn-Teller distortions, and ferroelectric transitions. Next, we move on to strong couplings between electronic charge and spin- and/or orbital- angular momentum, yielding materials with novel magnetic properties. We end with examples of the complete breakdown of single-particle band theory in so-called strongly correlated materials, which comprise for example heavy-fermion materials, frustrated magnets, materials with unusual metal-insulator transitions and the high-temperature superconductors.
Prerequisites / NoticeSolid State Physics and Chemistry of Materials I
Elective Courses
The students are free to choose individually from the entire course offer of ETH Zürich on the Master level. Please consult the study administration in case of questions.
NumberTitleTypeECTSHoursLecturers
327-0613-00LComputer Applications: Finite Elements in Solids and Structures Information
The course will only take place if at least 7 students are enrolled.
W4 credits2V + 2UA. Gusev
AbstractTo introduce the Finite Element Method to the students with a general interest in the topic
Learning objectiveTo introduce the Finite Element Method to the students with a general interest in the topic
ContentIntroduction; Energy formulations; Displacement finite elements; Solutions to the finite element equations; Linear elements; Convergence, compatibility and completeness; Higher order elements; Beam and frame elements, Plate and shell elements; Dynamics and vibration; Generalization of the Finite Element concepts (Galerkin-weighted residual and variational approaches)
Lecture notesAutographie
Literature- Astley R.J. Finite Elements in Solids and Structures, Chapman & Hill, 1992
- Zienkiewicz O.C., Taylor R.L. The Finite Element Method, 5th ed., vol. 1, Butterworth-Heinemann, 2000
327-2104-00LInorganic Thin Films: Processing, Properties and ApplicationsW2 credits2GT. Lippert, C. Schneider
AbstractIntroduction to thin films growth and properties. The nucleation and growth of thin film theory is presented and the obtainable microstructures are illustrated. Main processing and characterization techniques will be discussed.
Learning objectiveAchieve an understanding of major film growth methods, the most important growth mechanisms and characterization techniques.
To obtain a basic knowledge of specific thin film properties and selected applications.
ContentThis course gives an introduction to the topic of thin films growth with an emphasis on oxides, respectively oxide thin films. The main deposition techniques available for oxide thin film growth are physical and chemical vapor deposition techniques (PVD and CVD) as well as so called “wet techniques” (e.g. spin coating and spray pyrolysis). A special emphasis will be given to techniques which are important for industrial applications and basic research. A part of the course discusses vacuum technologies, materials selection and preparation.
The second main topic is thin film characterization which includes structural, chemical, mechanical, magnetic and electrical properties as well as the quantitative analysis of thin film composition. Finally, microfabrication and packaging are a topic of great technological importance and the basis for industrial applications.


I Table of Content

1 Introduction

2 Thin Film Fundamentals
2.1 Thin Film Formation
2.2 Thin Film Microstructure
2.3 Grain Growth
2.4 Epitaxy and Texture

3 Deposition Techniques
3.1 Vacuum Deposition Techniques
3.1.1 Evaporation and Molecular Beam Epitaxy (MBE)
3.1.2 Sputtering
3.1.3 Pulsed Laser Deposition (PLD)
3.1.4 Chemical Vapor Deposition
3.2 Non-Vacuum Deposition Techniques
3.2.1 Spray Pyrolysis
3.2.2 Sol Gel Deposition
3.2.3 Electroplating and Electrophoresis

4 Properties and Characterization
4.1 Surface and Mechanical Properties
4.2 Thermal Properties
4.3 Structural Properties
4.4 Compositional Analysis
4.5 Chemical Properties
4.6 Electrical and Magnetic Properties
4.7 Optical Properties

5 Industrial Applications
Lecture notesLecture notes will be provided.
LiteratureM. Ohring, “Materials science of thin films”, Academic Press
A. Elshabini-Riad, F.D. Barlow, “Thin film technology handbook”, Mc Graw Hill
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Restricted registration - show details
The number of seats is limited. In case of overbooking, the course will be repeated on the 11.06.-15.06.2018.

Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee (http://www.scopem.ethz.ch/education/MTP.html).
W2 credits3PS. Rodighiero, A. G. Bittermann, L. Grafulha Morales, K. Kunze, J. Reuteler
AbstractThe introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using 2 SEM instruments, students have the opportunity to study their own samples, or standard test samples, as well as solving exercises provided by ScopeM scientists.
Learning objective- Set-up, align and operate a SEM successfully and safely.
- Accomplish imaging tasks successfully and optimize microscope performances.
- Master the operation of a low-vacuum and field-emission SEM and EDX instrument.
- Perform sample preparation with corresponding techniques and equipment for imaging and analysis
- Acquire techniques in obtaining secondary electron and backscatter electron micrographs
- Perform EDX qualitative and semi-quantitative analysis
ContentDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized.

- Discussion of students' sample/interest
- Introduction and discussion on Electron Microscopy and instrumentation
- Lectures on electron sources, electron lenses and probe formation
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM
- Brief description and demonstration of the SEM microscope
- Practice on beam/specimen interaction, image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping
- Practice on real-world samples and report results
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
327-2126-00LMicroscopy Training TEM I - Introduction to TEM Restricted registration - show details
Number of participants limited to 6. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee (http://www.scopem.ethz.ch/education/MTP.html).
W2 credits3PS. Rodighiero, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, C. Zaubitzer
AbstractThe introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations, and hands-on sessions.
Learning objective- Overview of TEM theory, instrumentation, operation and applications.
- Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully.
- Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras.
- To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns.
- Overview of techniques for specimen preparation.
ContentUsing two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods.

- Introduction and discussion on Electron Microscopy and instrumentation.
- Lectures on electron sources, electron lenses and probe formation.
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM.
- Brief description and demonstration of the TEM microscope.
- Practice on beam/specimen interaction, image formation, Image contrast (and image processing).
- Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM).
- Student participation on sample preparation techniques.
- Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities.
- TEM alignment, calibration, correction to improve image contrast and quality.
- Electron diffraction.
- Practice on real-world samples and report results.
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
327-2130-00LIntroducing Photons, Neutrons and Muons for Materials Characterisation Restricted registration - show details
Does not take place this semester.
W4 credits6GL. Heyderman
AbstractThe aim of the course is that the students acquire a basic understanding on the interaction of photons, neutrons and muons with matter and how one can use these as tools to solve specific problems. The students will also acquire hands-on experience by designing and performing an experiment in a large scale facility of PSI (Swiss Light Source, Swiss Spallation Neutron Source, Swiss Muon Source).
Learning objectiveThe course runs for two weeks in a row in September before the regular semester lectures start. It takes place at the campus of the Paul Scherrer Institute. The first week consists of introductory lectures on the use of photons, neutrons and muons for materials characterization. Active participation of the students in the form of workgroups aimed at learning the basic concepts is also part of the first week program. The second week is focused on hand-on experiments on specific topics. The topical section includes tutorials and one to two experiments designed and performed by the students at one of the large scale facilities of PSI (Swiss Light Source, Swiss Spallation Neutron Source, Swiss Muon Source).
Content- Interaction of photons, neutrons and muons with matter
- Production of photons, neutrons and muons
- Experimental setups: optics and detectors
- Crystal symmetry, Bragg's law, reciprocal lattice, structure factors
- Elastic and inelastic scattering with neutrons and photons
- X-ray absorption spectroscopy, x-ray magnetic circular dichroism
- Polarized neutron scattering for the study of magnetic materials
- Imaging techniques using x-rays and neutrons
- Introduction to muon spin rotation
- Applications of muon spin rotation
Lecture notesSlides from the lectures will be available on the internet.
Literature- Philip Willmott: An Introduction to Synchrotron Radiation: Techniques and Applications, Wiley, 2011
- J. Als-Nielsen and D. McMorrow: Elements of Modern X-Ray Physics, Wiley, 2011.
Prerequisites / NoticeThis is a pre-semester block course for students who have attended courses on condensed matter or materials physics. Registration at the PSI website required by June 30th (http://indico.psi.ch/event/PSImasterschool).
327-2134-00LIntroduction to MetamaterialsW Dr2 credits2GH. Galinski
AbstractThe main course objectives are to introduce students to the exciting world of metamaterials designed for optical and mechanical applications. Focus is on its most important physical concepts and fabrication techniques.
Learning objectiveThe main course objectives are to introduce students to the exciting world of metamaterials designed for optical and mechanical applications. Focus is on its most important physical concepts and fabrication techniques.
ContentMetamaterials are artificial designer materials with properties that may not be found in nature. They can be designed to possess unique electromagnetic or mechanical properties, which allow to explore new physical phenomena such as negative refraction and negative Poisson's ratio, negative compressibility transitions, perfect lenses, optical and mechanical cloaking. In addition, metamaterials are promising candidates to improve the environment by enhancing energy harvesting from the sun.

Topics to be covered: Metal optics and plasmonics, metamaterials and metasurfaces, epsilon-near-zero (ENZ) materials, negative refraction, negative Poisson ratio materials, plasmonic-enhanced light harvesting.
327-2135-00LAdvanced Analytical TEM Restricted registration - show details W Dr2 credits3GA. Sologubenko, R. Erni, R. Schäublin
AbstractThe course focuses on the fundamental understanding and hands-on knowledge of analytical Transmission Electron Microscopy (ATEM) techniques: electron dispersive X-ray analysis (EDX), energy filtered TEM and electron energy loss spectroscopy (EELS). The lectures will be followed by demonstrations and acquisition sessions TEM instruments.The lectures on statistical treatment of raw data sets and on
Learning objective• Setting-up the optimal operation conditions for reliable EDX analysis and quantification.
• Setting-up the optimal operation conditions for the reliable EFTEM analyses.
• Setting-up the optimal operation conditions for the reliable EELS analyses.
• EDX data acquisition, on-line analysis and quantification.
• EFTEM data acquisition and analysis.
• EELS acquisition analyses.
Content1. Fundamentals of analytical TEM.
2. Electron Optics and Instrumentation. Spectrum Imaging.
3. Quantitative X-ray Spectrometry.
4. EELS.
5. EFTEM.
6. Statistical treatment of raw data.
7. EDX. Quantification and data evaluation.
8. Demonstrations on EDX, EELS, and EFTEM data acquisitions.
9. Practical sessions for students with provided specimens. Practical sessions for
students with their own specimens.
10. Questions and such: open discussion.
11. Student presentations.
Literature• Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
• Williams, Carter: Transmission Electron Microscopy, Plenum Press, 2nd Edition 2009
• Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscopy, 3rd Edition,
Springer, 2011.
Prerequisites / NoticeNo mandatory prerequisites. Prior attendance to EM Basic lectures (327-0703-00L, 227- 0390-00L) and to the Microscopy Training TEM I - Introduction to TEM course (327-2126- 00L) is recommended.
327-2221-00LAdvanced Surface Characterisation TechniquesW4 credits2V + 2UA. Rossi Elsener-Rossi
AbstractThis course will be dedicated to the application of surface analytical techniques for the characterization of nanostructured materials and the understanding of their reactivity. Applications to innovative materials relevant for industries will be provided during the course.
Learning objectiveAcquisition of a sound basis on qualitative and quantitative analysis of XPS, AES and SIMS data based on practical examples and exercises from tribology, polymer science, biomaterials, passivity, nanostructured materials (according to the interests of participants).

Learn the capabilities and limitations of the techniques for materials characterization.
ContentXPS and AES: Instrumental parameters (sources, analyzer); data acquisition; energy and intensity calibration; data processing (satellite subtraction, background subtraction, curve-fitting); qualitative analysis (BE shifts, satellites); quantitative analysis of homogeneous, layered and nanostructured surfaces.

Examples will cover chemical, physical, & electrical characterization of films, surfaces, particles & interfaces.

Errors in quantitative analysis; transmission function, comparison of data from different instruments; depth-profiling techniques; imaging acquisition and processing

SIMS: Principle of the technique; overview on the instrumentation: Choice of primary ion; Mass scale calibration; Linearity of the intensity scale (dead-time correction); Repeatability and reproducibility; an introduction to data interpretation and multivariate techniques will be also provided.

Composition depth-profiling by XPS and Auger over 100's nm is presented by using noble gas ions (e.g. Ar+) sputtering while acquiring spectra. The advantages and limitations of depth-profiling with C60 source that reduces or eliminates sputter induced artifacts for organic materials will be discussed.
Angle Resolved XPS in combination with mathematical methods can provide gradient and layer ordering information within the first monolayers down to 10 nm:practical examples will be presented.

ISO and ASTM standards will be also presented during the course.

Case studies, Visit to the laboratory, Computer-assisted data processing in the classroom.
Lecture notesCopy of the overheads will be available after the lecture.

Papers used for the case studies will be also distributed.
LiteratureD. Briggs, Surface analysis of polymers by XPS and static SIMS, Cambridge Solid State Science Series, 1998

J.C. Riviere and S. Myhra, Handbook of surface and Interface Analysis, Marcel Dekker Inc.

D. Briggs and M.P. Seah, Practical Surface Analysis, vol.1, John Wiley & Sons, Chichester.

J.C. Vickerman, Surface Analysis - the principal techniques, John Wiley & Sons, Chichester.
Prerequisites / NoticeThe students should have attended and passed the following exams:
general chemistry, general physics and an introductory course on surface analysis techniques.
327-2222-00LSoft Materials: from Fundamentals to Applications Information W3 credits2V + 1UL. Isa
AbstractThis course consists of a series of lectures, each focusing on a specific fundamental concept previously encountered by the student during basic courses, and on its direct relevance for soft materials and their applications (e.g. colloidal crystals, dense suspensions, emulsions, foams and liquid crystals).
Learning objectiveSoft materials, such as complex fluids, polymers, liquid crystals, foams etc. are of paramount importance in many technological applications and consumer products. Additionally, they also work as "open laboratories", where basic phenomena, normally studied at the atomic or molecular length and time scales, can be easily and directly observed at the micro and nanoscale.
The aim of this course is to offer the student the possibility to connect fundamental concepts (e.g. entropy or thermodynamic equilibrium), which too often stay as abstract constructions, to direct examples of soft materials. At the end of the course the student will have acquired advanced knowledge of soft matter systems and strengthened his/her background in basic physics and physical chemistry.
ContentEach lecture will be divided into two parts. In the first part a specific concept will be introduced and discussed. In the second part the implications for soft materials will be presented, often with practical demonstration in the class.
Examples are:
- Entropy and phase transitions; application to colloidal crystals.
- Thermodynamics versus kinetics; application to Pickering emulsions.
- Excluded volume; application to liquid crystals.
The detailed series will be presented at the beginning of the course.
Lecture notesNotes will be handed out during the lectures and published online before each lecture.
LiteratureProvided in the lecture notes.
Prerequisites / NoticePre-existing notions of physics, thermodynamics, physical chemistry and statistical mechanics are necessary
327-2133-00LAdvanced Joining TechnologiesW3 credits3GL. Da Silva Duarte
AbstractIntroduction to fundamental aspects of joining technologies of (dis)similar materials for severe operating conditions. Interface reaction processes of metal/alloys/ceramic. While focused on materials issues, issues related to joint design, processing, quality assurance, process economics, and joint performance in service will also be addressed.
Learning objectiveTechnical goals, the student will be able to:
1. Describe the fundamentals mechanisms of different joining technologies. Identify advantages and limitations of each method.
2. Be able to apply the basic knowledge on phase diagrams in order to choose the best alloys for joining, process parameters (Temperature and time), joining methods and costs.
3. Describe common types of joining defects and be able to describe their potential influences during application/service.
4. Predict microstructures and/or phase transformations of materials after the joining process based on the phase diagrams information.
5. Identify suitable characterization techniques (destructive and non-destructive testing) and assess the joining properties.
6. Understand diffusion phenomena affecting joining interface during industrial applications and the materials limitations in aggressive environments.
7. Identify and explain the influence of thermal stress affecting the joining interface of common engineering materials.
ContentThe most important types of joining and interface mechanisms will be presented and discussed during the different lectures. For each specific joining technology, relevant technology aspects of the process, experimental characterization (destructive and non- destructive) methods will be presented always bringing industry examples for each joining technology.
This combination allows the student to connect the basics of material science concepts with practical aspects of joining technology and the research on joining technologies.
Following topics will be presented:
1. Introduction to Joining Technologies
2. Phase diagrams and thermodynamics; their importance in joining process
3. The basic metallurgy of welding: Brazing, Transient-Liquid-Phase Bonding and Soldering
4. Coatings and nano-reactive foils as filler materials
5. Advanced joining of alloys and intermetallic alloys
6. Advanced joining of polymers, ceramics and composites
7. Advanced joining with dissimilar materials
8. Characterization techniques: Destructive and Non-destructive methods
9. Defects and joining reliability
10. Corrosion environments and hydrogen embrittlement
11. Joining technologies as repairing technique
12. Other advanced joining methods (e.g. living tissue)
Lecture notesA script in English covering the lecture content is available online on the ETHZ website. Hardcopies of the script will be distributed during the lecture.
LiteratureThe two following books cover pretty well the lecture content and offer additional and more detailed description of the phenomena/methods presented in the lecture script:

1) Solders and Soldering: Materials, Design, Production, and Analysis for Reliable Bonding by Howard H. The two following books cover pretty well the lecture content and offer additional and more detailed description of the phenomena/methods presented in the lecture script:

2) Principles of Soldering by Giles Humpston and David M. Jacobson. ASM International, 2004.Manko. McGraw-Hill Professional, 2001.
327-4105-00LIntegrity of Materials and StructuresW4 credits2V + 2UM. Roth, M.  Barbezat, T. Graule
AbstractThe course deals with failures in metallic and ceramic components as well as polymers and composites.
Learning objective1) Understanding of failure mechanisms.
2) Methodology of failure analysis.
3) Learn and understand how to apply the different investigation methods in an appropriate way.
ContentMETALS: Based on the fundamentals of the origination and appearance of fractures the influences of material, construction and fabrication on failure mechanisms are discussed. Special interest is devoted to detrimental operative conditions (mechanical, corrosive, thermal overload). This is demonstrated by case studies from different fields (aircrafts and turbines, machinery, building structures, etc.).
CERAMICS: Ceramics are used in applications where electrical insulation, resistance to wear, or the ability to withstand high temperatures are needed. Failure mechanisms in ceramic components under operating conditions are analyzed: corrosion due to fluids, erosion due to fluids loaded with particles, hot gas corrosion, creep.
POLYMERS: Methodology of failure analysis on polymer materials: system approach, mechanisms like aging in polymers, analysis of thermoplast, thermosets and elastomer failures based on application oriented cases. Team exercises on selected failure cases.
327-5102-00LMolecular and Materials Modelling Information W4 credits2V + 2UD. Passerone, C. Pignedoli
Abstract"Molecular and Materials Modelling" introduces the basic techniques to interpret experiments with contemporary atomistic simulation. These techniques include force fields or density functional theory (DFT) based molecular dynamics and Monte Carlo. Structural and electronic properties, thermodynamic and kinetic quantities, and various spectroscopies will be simulated for nanoscale systems.
Learning objectiveThe ability to select a suitable atomistic approach to model a nanoscale system, and to employ a simulation package to compute quantities providing a theoretically sound explanation of a given experiment. This includes knowledge of empirical force fields and insight in electronic structure theory, in particular density functional theory (DFT). Understanding the advantages of Monte Carlo and molecular dynamics (MD), and how these simulation methods can be used to compute various static and dynamic material properties. Basic understanding on how to simulate different spectroscopies (IR, STM, X-ray, UV/VIS). Performing a basic computational experiment: interpreting the experimental input, choosing theory level and model approximations, performing the calculations, collecting and representing the results, discussing the comparison to the experiment.
Lecture notesA script will be made available.
LiteratureD. Frenkel and B. Smit, Understanding Molecular Simulations, Academic Press, 2002.

M. P. Allen and D.J. Tildesley, Computer Simulations of Liquids, Oxford University Press 1990.

Andrew R. Leach, Molecular Modelling, principles and applications, Pearson, 2001
327-2223-00LAtomic Force Microscopy in Materials Science Restricted registration - show details
Number of participants limited to 18.
W4 credits6GN. Burnham, N. Spencer
AbstractThis course is a hands-on introduction to atomic force microscopy (AFM). It consists of lectures and practical exercises involving actual AFM use, macroscopic mechanical models of AFM, and computer simulations. Most lab work and the capstone research project will be done in teams of two or three students.
Learning objectiveThe objectives of the course are for students to become familiar with the concepts of and equipment for AFM, to understand their results, and to competently use an AFM for a short research project.
Lecture notesYouTube.com/AtomicForceMicro, NaioAFM Tutorials 1-8, AFM Lessons 1-30
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