Suchergebnis: Lerneinheiten im Frühjahrssemester 2022
Materialwissenschaft Master  | ||||||
 WahlfächerDen Studierenden steht das gesamte Lehrangebot der ETH Zürich auf Master-Stufe zur Auswahl offen. Bitte wenden Sie sich bei Unklarheiten ans Studiensekretariat. | ||||||
| Nummer | Titel | Typ | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|---|
| 327-0613-00L | Computer Applications: Finite Elements in Solids and Structures Findet dieses Semester nicht statt. The course will only take place if at least 7 students are enrolled. | W | 4 KP | 2V + 2U | A. Gusev | |
| 327-2104-00L | Inorganic Thin Films: Processing, Properties and Applications | W | 2 KP | 2G | C. Schneider, T. Lippert | |
| 327-2125-00L | Microscopy Training SEM I - Introduction to SEM  Limited number of participants. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee. (http://www.scopem.ethz.ch/education/MTP.html). Registration form: (Link) | W | 2 KP | 3P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler | |
| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM Number of participants limited to 6. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee (http://www.scopem.ethz.ch/education/MTP.html). TEM 1 registration form: (Link) | W | 2 KP | 3P | P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger | |
| 327-2128-00L | High Resolution Transmission Electron Microscopy Findet dieses Semester nicht statt. Limited number of participants. More information here: https://scopem.ethz.ch/education/MTP.html Registration form: (Link) | W | 2 KP | 3G | R. Erni | |
| 327-2129-00L | Analytical Electron Microscopy: EDS | W | 1 KP | 2P | P. Zeng, L. Grafulha Morales, K. Kunze, A. Sologubenko | |
| 327-2130-00L | Introducing Photons, Neutrons and Muons for Materials Characterisation Only for MSc Materials Science and MSc Physics. | W | 2 KP | 3G | A. Hrabec | |
| 327-2133-00L | Advanced Joining Technologies | W | 3 KP | 3G | L. Da Silva Duarte | |
| 327-2134-00L | Introduction to Metamaterials | W Dr | 2 KP | 2G | H. Galinski | |
| 327-2135-00L | Advanced Analytical TEM Findet dieses Semester nicht statt. Number of participants limited to 12. Master students will have priority over PhD students. More information here: https://scopem.ethz.ch/education/MTP.html | W Dr | 2 KP | 3G | keine Angaben | |
| 327-2139-00L | Diffraction Physics in Materials Science | W | 3 KP | 3G | R. Erni | |
| 327-2140-00L | Focused Ion Beam and Applications Number of participants limited to 6. PhD students will be asked for a fee. https://scopem.ethz.ch/education/MTP.html Registration form: (Link) | W Dr | 1 KP | 2P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler | |
| 327-2141-00L | Materials+ Number of participants is limited to 25. MSc Materials Science students will have priority over other students. | W | 6 KP | 6G | H. Galinski, R. Nicolosi Libanori | |
| 327-2142-00L | Organic Electronic Materials This course will take place at EPFL and will be streamed to students enrolled at ETHZ. | W | 4 KP | 3V + 1U | H. Frauenrath | |
| 327-2144-00L | Microscopy Training Cryogenic Electron Microscopy | W | 1 KP | 2P | M. Peterek, B. Qureshi, E. J. Barthazy Meier, S. Handschin, M. S. Lucas-Droste, P. Zeng | |
| 327-2221-00L | Advanced Surface Characterisation Techniques | W | 4 KP | 2V + 2U | A. Rossi Elsener-Rossi | |
| 327-2223-00L | Atomic Force Microscopy in Materials Science Maximale Teilnehmerzahl: 18 | W | 4 KP | 6G | N. Burnham, L. Isa | |
| 327-2224-00L | MaP Distinguished Lecture Series on Additive Manufacturing This course is primarily designed for MSc and doctoral students. Guests are welcome. | W Dr | 1 KP | 2S | R. Katzschmann, L. De Lorenzis, L. Schefer | |
| 327-2225-00L | MaP Distinguished Lecture Series on Soft Robotics Findet dieses Semester nicht statt. This course is primarily designed for MSc and doctoral students. Guests are welcome. | W Dr | 1 KP | 2S | R. Katzschmann | |
| 327-4105-00L | Integrity of Materials and Structures | W | 4 KP | 2V + 2U | G. Piskoty, M. Barbezat, T. Graule | |
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