Suchergebnis: Lerneinheiten im Herbstsemester 2020
Doktorat Departement Materialwissenschaft  Weitere Informationen unter: https://www.ethz.ch/de/doktorat.html | ||||||
 Lehrangebot Doktorat und Postdoktorat | ||||||
| Nummer | Titel | Typ | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|---|
| » Auswahl aus sämtlichen Lehrveranstaltungen der ETH Zürich | ||||||
| 327-0710-00L | Polymer Physics  | E- | 0 KP | 2S | M. Kröger, H. C. Öttinger | |
| 327-0711-00L | Metal Physics and Technology Seminar | E- | 0 KP | 2S | J. F. Löffler | |
| 327-0712-00L | Nanometallurgie | E- | 0 KP | 2S | R. Spolenak | |
| 327-1300-00L | Joint Group Seminar Nur für D-MATL Doktorierende | E- | 0 KP | 1S | M. Fiebig, N. Spaldin | |
| 327-6100-00L | Materials Colloquium | E- | 0 KP | weitere Dozierende | ||
| 327-0721-00L | Writing for Publication in Materials Science Maximale Teilnehmerzahl: 15 Nur für D-MATL Doktorierende. | W | 2 KP | 1G | R. Mihalka | |
| 327-2125-00L | Microscopy Training SEM I - Introduction to SEM The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (http://www.scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | W | 2 KP | 3P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler | |
| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (http://www.scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | W | 2 KP | 3P | P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger | |
| 327-2128-00L | High Resolution Transmission Electron Microscopy | W | 2 KP | 3G | A. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng | |
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