327-2125-00L Microscopy Training SEM I - Introduction to SEM
| Semester | Frühjahrssemester 2023 |
| Dozierende | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, F. Lucas, J. Reuteler |
| Periodizität | jedes Semester wiederkehrende Veranstaltung |
| Lehrsprache | Englisch |
| Kommentar | Limited number of participants. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee. (http://www.scopem.ethz.ch/education/MTP0.html). Registration form: (Link) |
Lehrveranstaltungen
| Nummer | Titel | Umfang | Dozierende | |||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 327-2125-00 P | Microscopy Training SEM I - Introduction to SEM
 This block course will take place during 5 full days (9am-5pm) on March 6-10, 2023. Lectures will be held in the seminar room, practical exercises in rooms of ScopeM. | 35s Std. |
| P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, F. Lucas, J. Reuteler |
Katalogdaten
| Kurzbeschreibung | Der Einführungskurs in Rasterelektronenmikroskopie (SEM) betont praktisches Lernen. Die Studierenden haben die Möglichkeit an zwei Elektronenmikroskopen ihre eigenen Proben oder Standard-Testproben zu untersuchen, sowie von ScopeM-Wissenschafler vorbereitete Übungen zu lösen. |
| Lernziel | - Set-up, align and operate a SEM successfully and safely. - Accomplish imaging tasks successfully and optimize microscope performances. - Master the operation of a low-vacuum and field-emission SEM and EDX instrument. - Perform sample preparation with corresponding techniques and equipment for imaging and analysis - Acquire techniques in obtaining secondary electron and backscatter electron micrographs - Perform EDX qualitative and semi-quantitative analysis |
| Inhalt | During the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications. This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized. - Discussion of students' sample/interest - Introduction and discussion on Electron Microscopy and instrumentation - Lectures on electron sources, electron lenses and probe formation - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM - Brief description and demonstration of the SEM microscope - Practice on beam/specimen interaction, image formation, image contrast (and image processing) - Student participation on sample preparation techniques - Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities - Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping - Practice on real-world samples and report results |
| Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 |
| Voraussetzungen / Besonderes | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. |
Leistungskontrolle
| Information zur Leistungskontrolle (gültig bis die Lerneinheit neu gelesen wird) | |
Leistungskontrolle als Semesterkurs | |
| ECTS Kreditpunkte | 2 KP |
| Prüfende | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, F. Lucas, J. Reuteler |
| Form | unbenotete Semesterleistung |
| Prüfungssprache | Englisch |
| Repetition | Repetition nur nach erneuter Belegung der Lerneinheit möglich. |
| Zusatzinformation zum Prüfungsmodus | Oral presentation and discussion about the SEM images and results obtained during the course. |
Lernmaterialien
| Keine öffentlichen Lernmaterialien verfügbar. | |
| Es werden nur die öffentlichen Lernmaterialien aufgeführt. |
Gruppen
| Keine Informationen zu Gruppen vorhanden. |
Einschränkungen
| Allgemein |  : Für Fachstudierende und Hörer/-innen ist eine Spezialbewilligung der Dozierenden notwendig |
| Plätze | Plätze beschränkt. Spezielles Auswahlverfahren. |
| Warteliste | Bis 29.08.2023 |
| Belegungsende | Belegung nur bis 27.02.2023 möglich |
