327-2202-00L  Size Effects in Materials

SemesterFrühjahrssemester 2021
DozierendeR. Spolenak
Periodizitätjährlich wiederkehrende Veranstaltung
LehrspracheEnglisch



Lehrveranstaltungen

NummerTitelUmfangDozierende
327-2202-00 GSize Effects in Materials4 Std.
Di09:45-11:30HCI H 8.1 »
Do09:45-11:30HCI H 8.1 »
R. Spolenak

Katalogdaten

KurzbeschreibungThe core of this course explains how the behavior of materials changes, when their external dimensions become small (usually on the micro- to nanometer length scale) until quantum effects become dominant. This is illustrated by examples from all materials classes and further substantiated by case studies of applications ranging from micro- and nanoelectronics to optoelectronics.
LernzielTeaching goals:

to learn which materials are used in electronics, microelectronics and optoelectronics and why

to understand how materials properties change when their external dimensions approach the micro- and nanoscale

to grasp the materials and processing issues involved in miniaturized electronic, mechanical and optical systems

to be exposed to state of the art technologies for fabrication and characterization of such systems
InhaltThe core of the course is the materials behavior in small dimensions. Focus will be put on scaling of electronic and mechanical properties, thin film mechanics, device reliability and integration issues when dissimilar materials are joined. Advanced characterization techniques specific to microcomponents will be presented. Finally possible future solutions to further miniaturization, such as carbon nanotubes or 3D integration molecular electronics, will be critically discussed. Excursions to microelectronic companies are part of the course.

Topics include:

Basics
Scaling laws and size effects
Energy scales in materials science
Length scales in materials science
Size-dependent color effects
Mechanical properties
Electronic properties
Measuring properties
Applications:
Fabrication of microcomponents
Materials for Microelectronics and MEMS/NEMS
Materials for Transistors
Quantum dots
Novel materials for optical telecommunication, optical information processing, optical data storage and data display
SkriptPlease visit the Moodle-link for this lecture
Literatur"Thin Film Materials: Stress, Surface Evolution and Failure", L. B. Freund and S. Suresh, Cambridge University Press, 2003.

"Metal Based Thin Films for Electronics", K. Wetzig and C. M. Schneider (Eds.), Wiley-VCH, 2003

More literature will be announced in class.
Voraussetzungen / BesonderesExcursion to IBM Laboratories, Rüschlikon

Prerequisites: Good understanding of materials science, equivalent to the Bachelor Degree in Materials Science at ETH Zurich

Leistungskontrolle

Information zur Leistungskontrolle (gültig bis die Lerneinheit neu gelesen wird)
Leistungskontrolle als Semesterkurs
ECTS Kreditpunkte4 KP
PrüfendeR. Spolenak
FormSemesterendprüfung
PrüfungsspracheEnglisch
RepetitionEs wird ein Repetitionstermin in den ersten zwei Wochen des unmittelbar nachfolgenden Semesters angeboten.
Zusatzinformation zum Prüfungsmodus90 min written exam, calculator and 2 A4 pages of formulas are allowed

Lernmaterialien

Keine öffentlichen Lernmaterialien verfügbar.
Es werden nur die öffentlichen Lernmaterialien aufgeführt.

Gruppen

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Einschränkungen

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Angeboten in

StudiengangBereichTyp
Materialwissenschaft MasterKernfächerW DrInformation