327-2202-00L Size Effects in Materials
| Semester | Frühjahrssemester 2021 |
| Dozierende | R. Spolenak |
| Periodizität | jährlich wiederkehrende Veranstaltung |
| Lehrsprache | Englisch |
Lehrveranstaltungen
| Nummer | Titel | Umfang | Dozierende | |||||||
|---|---|---|---|---|---|---|---|---|---|---|
| 327-2202-00 G | Size Effects in Materials | 4 Std. |
| R. Spolenak |
Katalogdaten
| Kurzbeschreibung | The core of this course explains how the behavior of materials changes, when their external dimensions become small (usually on the micro- to nanometer length scale) until quantum effects become dominant. This is illustrated by examples from all materials classes and further substantiated by case studies of applications ranging from micro- and nanoelectronics to optoelectronics. |
| Lernziel | Teaching goals: to learn which materials are used in electronics, microelectronics and optoelectronics and why to understand how materials properties change when their external dimensions approach the micro- and nanoscale to grasp the materials and processing issues involved in miniaturized electronic, mechanical and optical systems to be exposed to state of the art technologies for fabrication and characterization of such systems |
| Inhalt | The core of the course is the materials behavior in small dimensions. Focus will be put on scaling of electronic and mechanical properties, thin film mechanics, device reliability and integration issues when dissimilar materials are joined. Advanced characterization techniques specific to microcomponents will be presented. Finally possible future solutions to further miniaturization, such as carbon nanotubes or 3D integration molecular electronics, will be critically discussed. Excursions to microelectronic companies are part of the course. Topics include: Basics Scaling laws and size effects Energy scales in materials science Length scales in materials science Size-dependent color effects Mechanical properties Electronic properties Measuring properties Applications: Fabrication of microcomponents Materials for Microelectronics and MEMS/NEMS Materials for Transistors Quantum dots Novel materials for optical telecommunication, optical information processing, optical data storage and data display |
| Skript | Please visit the Moodle-link for this lecture |
| Literatur | "Thin Film Materials: Stress, Surface Evolution and Failure", L. B. Freund and S. Suresh, Cambridge University Press, 2003. "Metal Based Thin Films for Electronics", K. Wetzig and C. M. Schneider (Eds.), Wiley-VCH, 2003 More literature will be announced in class. |
| Voraussetzungen / Besonderes | Excursion to IBM Laboratories, Rüschlikon Prerequisites: Good understanding of materials science, equivalent to the Bachelor Degree in Materials Science at ETH Zurich |
Leistungskontrolle
| Information zur Leistungskontrolle (gültig bis die Lerneinheit neu gelesen wird) | |
Leistungskontrolle als Semesterkurs | |
| ECTS Kreditpunkte | 4 KP |
| Prüfende | R. Spolenak |
| Form | Semesterendprüfung |
| Prüfungssprache | Englisch |
| Repetition | Es wird ein Repetitionstermin in den ersten zwei Wochen des unmittelbar nachfolgenden Semesters angeboten. |
| Zusatzinformation zum Prüfungsmodus | 90 min written exam, calculator and 2 A4 pages of formulas are allowed |
Lernmaterialien
| Keine öffentlichen Lernmaterialien verfügbar. | |
| Es werden nur die öffentlichen Lernmaterialien aufgeführt. |
Gruppen
| Keine Informationen zu Gruppen vorhanden. |
Einschränkungen
| Keine zusätzlichen Belegungseinschränkungen vorhanden. |
Angeboten in
| Studiengang | Bereich | Typ | |
|---|---|---|---|
| Materialwissenschaft Master | Kernfächer | W Dr |  |