327-2137-00L Scattering Techniques for Material Characterization
| Semester | Autumn Semester 2020 |
| Lecturers | T. Weber, A. Sologubenko |
| Periodicity | yearly recurring course |
| Language of instruction | English |
| Comment | All enrolled students are initially placed on the “waiting list” until the registration deadline. In the case of more than 12 applicants, the students will be selected by the lecturers before the start of the lecture according to the priority criteria: master students before doctoral students, Material Science students before students of other departments. |
| Abstract | The lecture presents the currently most efficient experimental techniques for microstructure material characterization: X-ray diffraction (XRD) and transmission electron microscopy (TEM). The theoretical basics, instrumentation, complementarity and exclusivity of both techniques will be taught. The course includes practical elements and examples of current research projects at D-MATL. |
| Learning objective | Students are able to do: - systematically characterise the microstructure and phases of a given material with X-rays and electrons - select the right tool (source, instrument, measurement strategy) and design a workflow for solving a microstructure or phase analysis problem - describe possibilities and limitations of a given characterisation method - comprehensively store experimentally collected data in a repository following modern data management rules such that data can be evaluated by students not involved in the experiment - qualitatively and quantitatively evaluate and present experimental data and results collected by others |
| Content | The main goal of this praxis-oriented hands-on course is to give the students comprehensive insights into the most important aspects of microstructure characterisation with electrons and X-rays. One focus is on the complementarity and exclusiveness of the two techniques. Another essential facet is to link the course to every-day problems and materials of D-MATL projects: each topic will be introduced as a 5 – 10 min presentation about a related research project given by a D-MATL user of ScopeM or the D-MATL X-ray platform. After such an “appetizer”, we will introduce the topic and the relevant theory more formally, discuss how such problems can be solved with electrons and X-rays, discuss intrinsic and extrinsic advantages and limitations and explain the special requirements regarding instrumentation. |
| Literature | - Diffraction Analysis of the Microstructure of Materials, E.J. Mittemeijer, P.Scardi, Springer, 2004. - Fundamentals of Powder Diffraction and Structural Characterization of Materials, 2nd ed., V. K. Pecharsky, P. Y. Zavalij, Springer, 2009. - Transmission Electron Microscopy and Diffractometry of Materials, B. Fultz and J.M. Howe, Springer 2001. - Electron Microscopy and Analyses, 3rd ed., P. J. Goodhew, J. Humphreys, R. Beanland, Taylor & Francis 2001. |
| Prerequisites / Notice | Crystallography, X-ray diffraction and electron microscopy on the BSc level. All enrolled students are initially placed on the “waiting list” until the registration deadline. In the case of more than 12 applicants, the students will be selected by the lecturers before the start of the lecture according to the priority criteria: master students before doctoral students, Material Science students before students of other departments. |