651-1851-00L  Introduction to Scanning Electron Microscopy

SemesterAutumn Semester 2020
LecturersL. Grafulha Morales, J. Allaz, K. Kunze
Periodicityyearly recurring course
Language of instructionEnglish


AbstractIntroduction to Scanning Electron Microscopy and Microanalysis including Practical training.
ObjectiveIntroduction in scanning electron microscopy and microanalysis. Obtain practical experience in operating a SEM.
ContentFunctional principles and operation modes of a scanning electron microscope. Methods and application fields for
- imaging (SE, BSE, FSE, AE, CL),
- X-ray spectroscopy (EDX)
- Electron diffraction (EBSD, Channeling, Orientation Imaging).
Methods for sample preparation
Practical exercises.
Lecture notesScripts and operation manuals are provided during the course.
Literature- Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996).
- Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994).
- Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973).
- Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981).
Prerequisites / NoticeFull day block course after the end of HS