327-2135-00L  Advanced Analytical TEM

SemesterAutumn Semester 2020
Lecturersnot available
Periodicityevery semester recurring course
CourseDoes not take place this semester.
Language of instructionEnglish
CommentNumber of participants limited to 12.
Master students will have priority over PhD students.

More information here: Link



Courses

NumberTitleHoursLecturers
327-2135-00 GAdvanced Analytical TEM
Does not take place this semester.
40s hrsnot available

Catalogue data

AbstractThe course focuses on the fundamental understanding and hands-on knowledge of analytical Transmission Electron Microscopy (ATEM) techniques: electron dispersive X-ray analysis (EDX), energy filtered TEM and electron energy loss spectroscopy (EELS). The lectures will be followed by demonstrations and acquisition sessions TEM instruments.The lectures on statistical treatment of raw data sets and on
Objective• Setting-up the optimal operation conditions for reliable EDX analysis and quantification.
• Setting-up the optimal operation conditions for the reliable EFTEM analyses.
• Setting-up the optimal operation conditions for the reliable EELS analyses.
• EDX data acquisition, on-line analysis and quantification.
• EFTEM data acquisition and analysis.
• EELS acquisition analyses.
Content1. Fundamentals of analytical TEM.
2. Electron Optics and Instrumentation. Spectrum Imaging.
3. Quantitative X-ray Spectrometry.
4. EELS.
5. EFTEM.
6. Statistical treatment of raw data.
7. EDX. Quantification and data evaluation.
8. Demonstrations on EDX, EELS, and EFTEM data acquisitions.
9. Practical sessions for students with provided specimens. Practical sessions for
students with their own specimens.
10. Questions and such: open discussion.
11. Student presentations.
Literature• Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
• Williams, Carter: Transmission Electron Microscopy, Plenum Press, 2nd Edition 2009
• Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscopy, 3rd Edition,
Springer, 2011.
Prerequisites / NoticeNo mandatory prerequisites. Prior attendance to EM Basic lectures (327-0703-00L, 227- 0390-00L) and to the Microscopy Training TEM I - Introduction to TEM course (327-2126- 00L) is recommended.

Performance assessment

Performance assessment information (valid until the course unit is held again)
Performance assessment as a semester course
ECTS credits2 credits
Examiners
Typeungraded semester performance
Language of examinationEnglish
RepetitionRepetition only possible after re-enrolling for the course unit.

Learning materials

No public learning materials available.
Only public learning materials are listed.

Groups

No information on groups available.

Restrictions

PlacesLimited number of places. Special selection procedure.
Waiting listuntil 05.10.2020
End of registration periodRegistration only possible until 21.09.2020

Offered in

ProgrammeSectionType
Materials Science MasterElective CoursesW DrInformation