327-2128-00L  High Resolution Transmission Electron Microscopy

SemesterAutumn Semester 2020
LecturersA. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng
Periodicityevery semester recurring course
Language of instructionEnglish



Courses

NumberTitleHoursLecturers
327-2128-00 GHigh Resolution Transmission Electron Microscopy Special students and auditors need a special permission from the lecturers.
This blockcourse will take place from December 7-11, 2020, in the seminar room and rooms of ScopeM.
40s hrs
07.12.08:45-11:30HIT F 31.2 »
08.12.08:45-11:30HIT F 31.2 »
09.12.08:45-16:30HIT F 31.2 »
A. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng

Catalogue data

AbstractThis advanced course on High Resolution Transmission Electron Microscopy (HRTEM) provides lectures focused on HRTEM and HRSTEM imaging principles, related data analysis and simulation and phase restoration methods.
Objective- Learning how HRTEM and HRSTEM images are obtained.
- Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them.
- Learning about TEM and STEM images simulation software.
- Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).
ContentThis course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them.

Topics:
1. Introduction to HRTEM and HRSTEM
2. Considerations on (S)TEM instrumentation for high resolution imaging
3. Lectures on aberrations, aberration correction and aberration corrected images
4. HRTEM and HRSTEM simulation
5. Data analysis, phase restoration and lattice-strain analysis
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009
- Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016
- Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015.
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM TEM basic course
- Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science)
- Prior TEM experience

Performance assessment

Performance assessment information (valid until the course unit is held again)
Performance assessment as a semester course
ECTS credits2 credits
ExaminersA. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng
Typeungraded semester performance
Language of examinationEnglish
RepetitionRepetition only possible after re-enrolling for the course unit.
Additional information on mode of examinationoral presentation

Learning materials

No public learning materials available.
Only public learning materials are listed.

Groups

No information on groups available.

Restrictions

General : Special students and auditors need a special permission from the lecturers
PlacesLimited number of places. Special selection procedure.
Waiting listuntil 07.12.2020
End of registration periodRegistration only possible until 23.11.2020

Offered in

ProgrammeSectionType
Doctoral Department of Materials ScienceDoctoral and Post-Doctoral CoursesWInformation
Materials Science MasterElective CoursesWInformation