327-0504-00L Materials Characterisation Methods
| Semester | Autumn Semester 2019 |
| Lecturers | L. Heyderman |
| Periodicity | yearly recurring course |
| Language of instruction | English |
| Abstract | The lecture course is aimed at qualifying the student to choose the optimum characterization method according to the questions posed. The main topics are: Thermal Analysis (TD, TG, TM, DTA, DSC), light microscopy, diffraction methods (XRD, NRD, SAD), electron microscopy (TEM, HRTEM, STEM, HAADF-STEM, SEM, ESEM, EFEM, EDX, EELS). |
| Learning objective | The lecture course is aimed at qualifying the student to choose the optimum characterization method according to the questions posed. |
| Content | Introduction into the fundamentals of materials characterization: Thermal Analysis (TD, TG, TM, DTA, DSC), light microscopy, diffraction methods (XRD, NRD, SAD), electron microscopy (TEM, HRTEM, STEM, HAADF-STEM, SEM, ESEM, EFEM, EDX, EELS). The emphasis is on the discussion of the fundamentals of these characterization methods. |
| Lecture notes | Script is provided. |
| Literature | Materials Science and technology: A comprehensive treatment. ed. by R. W. Cahn, P. Haasen, E.J. Kramer. VCH Weinheim 1992, 1994. Volume 2 Characterization of Materials (Volume Editor E. Lifshin). |