327-0703-00L Electron Microscopy in Material Science
| Semester | Autumn Semester 2019 |
| Lecturers | K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger |
| Periodicity | yearly recurring course |
| Language of instruction | English |
Courses
| Number | Title | Hours | Lecturers | ||||
|---|---|---|---|---|---|---|---|
| 327-0703-00 V | Electron Microscopy in Materials Science | 2 hrs |
| K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger | |||
| 327-0703-00 U | Electron Microscopy in Materials Science | 2 hrs |
| K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger |
Catalogue data
| Abstract | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. |
| Learning objective | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. |
| Content | This course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported. |
| Lecture notes | will be distributed in English |
| Literature | Goodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000 Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014 Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013 Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008 Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015) |
Performance assessment
| Performance assessment information (valid until the course unit is held again) | |
Performance assessment as a semester course | |
| ECTS credits | 4 credits |
| Examiners | K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger |
| Type | session examination |
| Language of examination | English |
| Repetition | The performance assessment is offered every session. Repetition possible without re-enrolling for the course unit. |
| Mode of examination | oral 30 minutes |
| Additional information on mode of examination | BITTE BEACHTEN: Die mündliche Prüfung dauert 30 MINUTEN pro Kandidat. Aus technischen Gründen kann die Angabe im Vorlesungsverzeichnis davon abweichen. PLEASE NOTE: The oral exam takes 30 minutes per candidate. For technical reasons in the course catalog the published time per candidate can differ. ZWISCHENPRÜFUNG: Ein schriftlicher Test findet Mitte des Semesters statt. Teilnahme ist fakultativ. Ergebnis wird zu 30% an die Gesamtnote angerechnet, wenn damit eine bessere Note erreicht wird. INTERIM ASSESSMENT: A written test takes place in mid semester. Attendance is optional. Result will be counted with 30% weight for final mark, if this would lead to a better mark. |
| This information can be updated until the beginning of the semester; information on the examination timetable is binding. | |
Learning materials
| No public learning materials available. | |
| Only public learning materials are listed. |
Groups
| No information on groups available. |
Restrictions
| There are no additional restrictions for the registration. |
