151-0622-00L  Measuring on the Nanometer Scale

SemesterFrühjahrssemester 2019
DozierendeA. Stemmer
Periodizitätjährlich wiederkehrende Veranstaltung
LehrspracheEnglisch


KurzbeschreibungIntroduction to theory and practical application of measuring techniques suitable for the nano domain.
LernzielIntroduction to theory and practical application of measuring techniques suitable for the nano domain.
InhaltConventional techniques to analyze nano structures using photons and electrons: light microscopy with dark field and differential interference contrast; scanning electron microscopy, transmission electron microscopy. Interferometric and other techniques to measure distances. Optical traps. Foundations of scanning probe microscopy: tunneling, atomic force, optical near-field. Interactions between specimen and probe. Current trends, including spectroscopy of material parameters.
SkriptClass notes and special papers will be distributed.