Hands-on course on in situ spectroscopies (x-ray, infrared, Raman) and x-ray diffraction for understanding the structure of functional materials.
Thorough understanding of available state-of-the-art spectroscopies for the characterization of the structure of functional materials under in situ conditions. Problem solving strategies and reporting in a scientific format. To learn the basics of spectroscopic data analysis.
This course will introduce state-of-the art synchrotron techniques (x-ray absorption and emission spectroscopies, x-ray diffraction) as well as complementary infrared and Raman spectroscopies for the characterization of functional materials, such as catalysts, under operating (in situ) conditions. On the ‘cook’ days, each technique will be introduced by a lecture, after which samples will be ‘cooked’ (sample preparation, building in situ setup, and measurement). This will be followed by a ‘look’ day where the collected data will be analyzed. Principles of x-ray data treatment, including Fourier transformation, will be introduced.
A course manual with in depth background information will be distributed before the course.
Will be suggested in the course manual and made available during the course.
Voraussetzungen / Besonderes
The course will take place at the Swiss Light Source, at the Paul Scherrer Institut. Students will be housed for several nights in the guest house. You are required to contact the organizers upon registration since beamtime and housing has to be reserved well in advance.
Information zur Leistungskontrolle (gültig bis die Lerneinheit neu gelesen wird)