327-2126-00L Microscopy Training TEM I - Introduction to TEM
|Semester||Spring Semester 2019|
|Lecturers||M. Willinger, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm|
|Periodicity||every semester recurring course|
|Language of instruction||English|
|Comment||Number of participants limited to 6. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee (http://www.scopem.ethz.ch/education/MTP.html).|
TEM 1 registration form: Link
|327-2126-00 P||Microscopy Training TEM I - Introduction to TEM
This block course will take place from March 11.-15., 2019. On 13., 14. and 15. March at ScopeM.
A repetition of the course will take place from July 1.-5., 2019. On 3., 4., and 5. July at ScopeM.
|M. Willinger, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm|
|Abstract||The introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations, and hands-on sessions.|
|Objective||- Overview of TEM theory, instrumentation, operation and applications.|
- Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully.
- Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras.
- To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns.
- Overview of techniques for specimen preparation.
|Content||Using two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods.|
- Introduction and discussion on Electron Microscopy and instrumentation.
- Lectures on electron sources, electron lenses and probe formation.
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM.
- Brief description and demonstration of the TEM microscope.
- Practice on beam/specimen interaction, image formation, Image contrast (and image processing).
- Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM).
- Student participation on sample preparation techniques.
- Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities.
- TEM alignment, calibration, correction to improve image contrast and quality.
- Electron diffraction.
- Practice on real-world samples and report results.
|Literature||- Detailed course manual|
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
|Prerequisites / Notice||No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.|
|Performance assessment information (valid until the course unit is held again)|
|Performance assessment as a semester course|
|ECTS credits||2 credits|
|Examiners||F. Gramm, E. J. Barthazy Meier, A. G. Bittermann, M. Willinger|
|Type||ungraded semester performance|
|Language of examination||English|
|Repetition||Repetition only possible after re-enrolling for the course unit.|
|Additional information on mode of examination||Oral presentation and discussion about the TEM/STEM images and results obtained during the course.|
|No public learning materials available.|
|Only public learning materials are listed.|
|No information on groups available.|
|General||: Special students and auditors need a special permission from the lecturers|
|Places||Limited number of places. Special selection procedure.|
|Waiting list||until 30.06.2019|
|End of registration period||Registration only possible until 01.03.2019|