327-2126-00L  Microscopy Training TEM I - Introduction to TEM

SemesterSpring Semester 2019
LecturersM. Willinger, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm
Periodicityevery semester recurring course
Language of instructionEnglish
CommentNumber of participants limited to 6. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee (http://www.scopem.ethz.ch/education/MTP.html).

TEM 1 registration form: Link



Courses

NumberTitleHoursLecturers
327-2126-00 PMicroscopy Training TEM I - Introduction to TEM Special students and auditors need a special permission from the lecturers.
This block course will take place from March 11.-15., 2019. On 13., 14. and 15. March at ScopeM.
A repetition of the course will take place from July 1.-5., 2019. On 3., 4., and 5. July at ScopeM.
40s hrs
11.03.08:45-11:30HIT F 32 »
12.03.08:45-11:30HIT F 32 »
01.07.08:45-11:30HIT F 32 »
02.07.08:45-11:30HIT F 32 »
M. Willinger, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm

Catalogue data

AbstractThe introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations, and hands-on sessions.
Learning objective- Overview of TEM theory, instrumentation, operation and applications.
- Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully.
- Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras.
- To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns.
- Overview of techniques for specimen preparation.
ContentUsing two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods.

- Introduction and discussion on Electron Microscopy and instrumentation.
- Lectures on electron sources, electron lenses and probe formation.
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM.
- Brief description and demonstration of the TEM microscope.
- Practice on beam/specimen interaction, image formation, Image contrast (and image processing).
- Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM).
- Student participation on sample preparation techniques.
- Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities.
- TEM alignment, calibration, correction to improve image contrast and quality.
- Electron diffraction.
- Practice on real-world samples and report results.
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.

Performance assessment

Performance assessment information (valid until the course unit is held again)
Performance assessment as a semester course
ECTS credits2 credits
ExaminersF. Gramm, E. J. Barthazy Meier, A. G. Bittermann, M. Willinger
Typeungraded semester performance
Language of examinationEnglish
RepetitionRepetition only possible after re-enrolling for the course unit.
Additional information on mode of examinationOral presentation and discussion about the TEM/STEM images and results obtained during the course.

Learning materials

No public learning materials available.
Only public learning materials are listed.

Groups

No information on groups available.

Restrictions

General : Special students and auditors need a special permission from the lecturers
PlacesLimited number of places. Special selection procedure.
Waiting listuntil 30.06.2019
End of registration periodRegistration only possible until 01.03.2019

Offered in

ProgrammeSectionType
Health Sciences and Technology MasterElective Courses IIWInformation
Health Sciences and Technology MasterElective Courses IIWInformation
Health Sciences and Technology MasterElective Courses IIWInformation
Health Sciences and Technology MasterElective Courses IIWInformation
Materials Science MasterElective CoursesWInformation