151-0622-00L  Measuring on the Nanometer Scale

SemesterSpring Semester 2015
LecturersA. Stemmer
Periodicityyearly recurring course
Language of instructionEnglish


AbstractIntroduction to theory and practical application of measuring techniques suitable for the nano domain.
Learning objectiveIntroduction to theory and practical application of measuring techniques suitable for the nano domain.
ContentConventional techniques to analyze nano structures using photons and electrons: light microscopy with dark field and differential interference contrast; scanning electron microscopy, transmission electron microscopy. Interferometric and other techniques to measure distances. Optical traps. Foundations of scanning probe microscopy: tunneling, atomic force, optical near-field. Interactions between specimen and probe. Current trends, including spectroscopy of material parameters.
Lecture notesClass notes and special papers will be distributed.
Prerequisites / NoticeThis course is taught together with T. Wagner and H. Beyer.