Introduction to theory and practical application of measuring techniques suitable for the nano domain.
Learning objective
Introduction to theory and practical application of measuring techniques suitable for the nano domain.
Content
Conventional techniques to analyze nano structures using photons and electrons: light microscopy with dark field and differential interference contrast; scanning electron microscopy, transmission electron microscopy. Interferometric and other techniques to measure distances. Optical traps. Foundations of scanning probe microscopy: tunneling, atomic force, optical near-field. Interactions between specimen and probe. Current trends, including spectroscopy of material parameters.
Lecture notes
Class notes and special papers will be distributed.
Prerequisites / Notice
This course is taught together with T. Wagner and H. Beyer.
Performance assessment
Performance assessment information (valid until the course unit is held again)
Performance assessment as a semester course