327-2128-00L High Resolution Transmission Electron Microscopy
| Semester | Autumn Semester 2018 |
| Lecturers | |
| Periodicity | every semester recurring course |
| Course | Does not take place this semester. |
| Language of instruction | English |
| Comment | Number of participants limited. Students who wish to obtain ECTS points need to participate at additional hands-on sessions at ScopeM and EMPA. A separate registration is necessary: HRTEM registration form (Link) and PhD-Students will be asked for a fee ( ScopeM MTP - http://www.scopem.ethz.ch/education/MTP.html ). |
Courses
| Number | Title | Hours | Lecturers | |
|---|---|---|---|---|
| 327-2128-00 G | High Resolution Transmission Electron Microscopy
 Does not take place this semester. | 40s hrs |
Catalogue data
| Abstract | This advanced course on High Resolution Transmission Electron Microscopy (HRTEM) provides lectures focused on HRTEM and HRSTEM imaging principles, related data analysis and simulation and phase restoration methods. |
| Learning objective | - Learning how HRTEM and HRSTEM images are obtained. - Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them. - Learning about TEM and STEM images simulation software. - Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions). |
| Content | This course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them. Topics: 1. Introduction to HRTEM and HRSTEM 2. Considerations on (S)TEM instrumentation for high resolution imaging 3. Lectures on aberrations, aberration correction and aberration corrected images 4. HRTEM and HRSTEM simulation 5. Data analysis, phase restoration and lattice-strain analysis |
| Literature | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009 - Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016 - Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015. - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 |
| Prerequisites / Notice | The students should fulfil one or more of these prerequisites: - Prior attendance to the ScopeM TEM basic course - Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science) - Prior TEM experience |
Performance assessment
| Performance assessment information (valid until the course unit is held again) | |
Performance assessment as a semester course | |
| ECTS credits | 2 credits |
| Examiners | A. Sologubenko, R. Erni, R. Schäublin |
| Type | ungraded semester performance |
| Language of examination | English |
| Repetition | Repetition only possible after re-enrolling for the course unit. |
| Additional information on mode of examination | oral presentation |
Learning materials
| No public learning materials available. | |
| Only public learning materials are listed. |
Groups
| No information on groups available. |
Restrictions
| General |  : Special students and auditors need a special permission from the lecturers |
| Places | Limited number of places. Special selection procedure. |
| Waiting list | until 15.10.2018 |
| End of registration period | Registration only possible until 08.10.2018 |
Offered in
| Programme | Section | Type | |
|---|---|---|---|
| Doctoral Department of Materials Science | Doctoral and Post-Doctoral Courses | W |  |