151-0628-00L Scanning Probe Microscopy Lab
| Semester | Spring Semester 2018 |
| Lecturers | A. Stemmer, T. Wagner |
| Periodicity | yearly recurring course |
| Language of instruction | English |
| Comment | Limited number of participants. Please address your application to Andreas Stemmer (astemmer@ethz.ch). Simultaneous enrolment in 151-0622-00L Measuring on the Nanometer Scale is required. |
| Performance assessment information (valid until the course unit is held again) | |
Performance assessment as a semester course | |
| ECTS credits | 2 credits |
| Examiners | A. Stemmer, T. Wagner |
| Type | graded semester performance |
| Language of examination | English |
| Repetition | Repetition possible without re-enrolling for the course unit. |
| Additional information on mode of examination | Credit points can only be earned if the candidate (i) actively takes part in the entire course, (ii) turns in a final report, and (iii) obtains at least grade 4. The grade reflects the performance of each participant and is based on (1) effort/ participation (30%), (2) skills shown during the course (30%), and (3) quality of the report (40%). |