Alla Sologubenko: Catalogue data in Autumn Semester 2020

Name	Dr. Alla Sologubenko
Address	ScopeM ETH Zürich, HPM C 57.3 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND
Telephone	+41 44 633 68 12
E-mail	alla.sologubenko@scopem.ethz.ch
URL	https://scopem.ethz.ch/
Department	Materials
Relationship	Lecturer

Number	Title	ECTS	Hours	Lecturers
327-2126-00L	Microscopy Training TEM I - Introduction to TEM The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (http://www.scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date.	2 credits	3P	P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger
Abstract	The introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for beginners who are interested in using TEM for their Master or PhD thesis. TEM sample preparation techniques are also discussed. During hands-on sessions at different TEM instruments, students will have the opportunity to examine their own samples if time allows.
Learning objective	Understanding of 1. the set-up and individual components of a TEM 2. the basics of electron optics and image formation 3. the basics of electron beam – sample interactions 4. the contrast mechanism 5. various sample preparation techniques Learning how to 1. align and operate a TEM 2. acquire data using different operation modes of a TEM instrument, i.e. Bright-field and Dark-field imaging 3. record electron diffraction patterns and index diffraction patterns 4. interpret TEM data
Content	Lectures: - basics of electron optics and the TEM instrument set-up - TEM imaging modes and image contrast - STEM operation mode - Sample preparation techniques for hard and soft materials Practicals: - Demo, practical demonstration of a TEM: instrument components, alignment, etc. - Hands-on training for students: sample loading, instrument alignment and data acquisition. - Sample preparation for different types of materials - Practical work with TEMs - Demonstration of advanced Transmission Electron Microscopy techniques
Lecture notes	Lecture notes will be distributed.
Literature	- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / Notice	No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551-1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
327-2128-00L	High Resolution Transmission Electron Microscopy	2 credits	3G	A. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng
Abstract	This advanced course on High Resolution Transmission Electron Microscopy (HRTEM) provides lectures focused on HRTEM and HRSTEM imaging principles, related data analysis and simulation and phase restoration methods.
Learning objective	- Learning how HRTEM and HRSTEM images are obtained. - Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them. - Learning about TEM and STEM images simulation software. - Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).
Content	This course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them. Topics: 1. Introduction to HRTEM and HRSTEM 2. Considerations on (S)TEM instrumentation for high resolution imaging 3. Lectures on aberrations, aberration correction and aberration corrected images 4. HRTEM and HRSTEM simulation 5. Data analysis, phase restoration and lattice-strain analysis
Literature	- Detailed course manual - Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009 - Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016 - Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015. - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / Notice	The students should fulfil one or more of these prerequisites: - Prior attendance to the ScopeM TEM basic course - Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science) - Prior TEM experience
327-2129-00L	Analytical Electron Microscopy	1 credit	2P	P. Zeng, L. Grafulha Morales, K. Kunze, A. Sologubenko
Abstract	The main goal of this hands-on course is to provide students with fundamental understanding of underlying physical processes, experimental set-up solutions and hands-on practical experience of analytical electron microscopy (AEM) technique for microstructure characterisation, specifically Energy Dispersive X-ray Spectroscopy (EDS) and spectrum imaging (SI) technique.
Learning objective	- understanding of physical processes that enable the EDS technique and data evaluation algorithms; - hand-on experience of data acquisition and evaluation routines including o practical understanding of different data acquisition set-ups, o optimization of acquisition parameters for most reliable quantification of the results, o the knowledge of the available and most reliable quantification algorithms and their handling o the knowledge of data evaluation routines and possible handicaps for reliable elemental content distribution analyses and material composition quantification o the effect of the specimen geometry on the data and experimental solutions for minimization of the artefacts
Content	This advanced course provides analytical EM techniques to the students with prior EM experience (TEM or SEM). At the end of the course, students will understand the physical processes that enable the EDS technique and data evaluation algorithms and apply the technique for their own research. - Introduction to analytical electron microscopy: theory and instrumentation. - Lectures on EDS, WDS - Practical on EDS-SEM: data acquisition and analysis. - Practical on EDS-TEM: data acquisition and analysis. The hand-on trainings are to be carried-out on a real-life specimen, provided by lecturers and / by students.
Lecture notes	Provided in the course Moodle-page
Literature	- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM. Springer Verlag, 2007 - Williams & Carter: Transmission Electron Microscopy: A Textbook for Material Sciences. Plenum Press, 2nd Edition 2009, ISBD: 0 306 45247-2 - Goodhew, Humphreys & Beanland: Electron Microscopy and Analyses, Third edition. CRC Press, 2000 - Carter & Williams: Transmission Electron Microscopy: Diffraction, Imaging and Spectrometry. Springer Verlag, 2016, DOI: 10.1007/978-3-319-26651-0 - Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press, 2010
Prerequisites / Notice	- Master student or PhD student who has experience with EM (SEM or TEM) techniques or prior attendance of one of the following courses: Microscopy Training SEM1 (327-2125-00L) or Microscopy Training TEM1(327-2126-00L) - Attendance of the following courses is of advantage, but not required: Scattering Techniques for Material Characterization (327-2137-00L) or Elements of Microscopy (227-0390-00L) or Electron Microscopy in Material Science (327-0703-00L)
327-2137-00L	Scattering Techniques for Material Characterization All enrolled students are initially placed on the “waiting list” until the registration deadline. In the case of more than 12 applicants, the students will be selected by the lecturers before the start of the lecture according to the priority criteria: master students before doctoral students, Material Science students before students of other departments.	3 credits	2V + 1U	T. Weber, A. Sologubenko
Abstract	The lecture presents the currently most efficient experimental techniques for microstructure material characterization: X-ray diffraction (XRD) and transmission electron microscopy (TEM). The theoretical basics, instrumentation, complementarity and exclusivity of both techniques will be taught. The course includes practical elements and examples of current research projects at D-MATL.
Learning objective	Students are able to do: - systematically characterise the microstructure and phases of a given material with X-rays and electrons - select the right tool (source, instrument, measurement strategy) and design a workflow for solving a microstructure or phase analysis problem - describe possibilities and limitations of a given characterisation method - comprehensively store experimentally collected data in a repository following modern data management rules such that data can be evaluated by students not involved in the experiment - qualitatively and quantitatively evaluate and present experimental data and results collected by others
Content	The main goal of this praxis-oriented hands-on course is to give the students comprehensive insights into the most important aspects of microstructure characterisation with electrons and X-rays. One focus is on the complementarity and exclusiveness of the two techniques. Another essential facet is to link the course to every-day problems and materials of D-MATL projects: each topic will be introduced as a 5 – 10 min presentation about a related research project given by a D-MATL user of ScopeM or the D-MATL X-ray platform. After such an “appetizer”, we will introduce the topic and the relevant theory more formally, discuss how such problems can be solved with electrons and X-rays, discuss intrinsic and extrinsic advantages and limitations and explain the special requirements regarding instrumentation.
Literature	- Diffraction Analysis of the Microstructure of Materials, E.J. Mittemeijer, P.Scardi, Springer, 2004. - Fundamentals of Powder Diffraction and Structural Characterization of Materials, 2nd ed., V. K. Pecharsky, P. Y. Zavalij, Springer, 2009. - Transmission Electron Microscopy and Diffractometry of Materials, B. Fultz and J.M. Howe, Springer 2001. - Electron Microscopy and Analyses, 3rd ed., P. J. Goodhew, J. Humphreys, R. Beanland, Taylor & Francis 2001.
Prerequisites / Notice	Crystallography, X-ray diffraction and electron microscopy on the BSc level. All enrolled students are initially placed on the “waiting list” until the registration deadline. In the case of more than 12 applicants, the students will be selected by the lecturers before the start of the lecture according to the priority criteria: master students before doctoral students, Material Science students before students of other departments.