Luiz Grafulha Morales: Katalogdaten im Herbstsemester 2020

NameHerr Dr. Luiz Grafulha Morales
Adresse
ScopeM
ETH Zürich, HPM C 57.3
Otto-Stern-Weg 3
8093 Zürich
SWITZERLAND
Telefon+41 44 633 37 46
E-Mailluiz.morales@scopem.ethz.ch
DepartementErdwissenschaften
BeziehungDozent

NummerTitelECTSUmfangDozierende
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Belegung eingeschränkt - Details anzeigen
The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list.

For PhD students, postdocs and others, a fee will be charged (Link).

All applicants must additionally register on this form: Link
The selected applicants will be contacted and asked for confirmation a few weeks before the course date.
2 KP3PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler
KurzbeschreibungThis introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using ScopeM SEMs, students have the opportunity to study their own samples (or samples provided) and solve practical problems by applying knowledge acquired during the lectures. At the end of the course, students will be able to apply SEM for their (future) research projects.
Lernziel- Set-up, align and operate a SEM successfully and safely.
- Understand important operational parameters of SEM and optimize microscope performance.
- Explain different signals in SEM and obtain secondary electron (SE) and backscatter electron (BSE) images.
- Operate the SEM in low-vacuum mode.
- Make use of EDX for semi-quantitative elemental analysis.
- Prepare samples with different techniques and equipment for imaging and analysis by SEM.
InhaltDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students are able to align an SEM, to obtain secondary electron (SE) and backscatter electron (BSE) images and to perform energy dispersive X-ray spectroscopy (EDX) semi-quantitative analysis. Emphasis is put on procedures to optimize SEM parameters in order to best solve practical problems and deal with a wide range of materials.

Lectures:
- Introduction on Electron Microscopy and instrumentation
- electron sources, electron lenses and probe formation
- beam/specimen interaction, image formation, image contrast and imaging modes.
- sample preparation techniques for EM
- X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescan and spectral mapping

Practicals:
- Brief description and demonstration of the SEM microscope
- Practice on image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Practice on real-world samples and report results
SkriptLecture notes will be distributed.
Literatur- Peter Goodhew, John Humphreys, Richard Beanland: Electron Microscopy and Analysis, 3rd ed., CRC Press, 2000
- Joseph Goldstein, et al, Scanning Electron Microscopy and X-Ray Microanalysis, 4th ed, Srpinger US, 2018
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesNo mandatory prerequisites.
327-2129-00LAnalytical Electron Microscopy Belegung eingeschränkt - Details anzeigen 1 KP2PP. Zeng, L. Grafulha Morales, K. Kunze, A. Sologubenko
KurzbeschreibungThe main goal of this hands-on course is to provide students with fundamental understanding of underlying physical processes, experimental set-up solutions and hands-on practical experience of analytical electron microscopy (AEM) technique for microstructure characterisation, specifically Energy Dispersive X-ray Spectroscopy (EDS) and spectrum imaging (SI) technique.
Lernziel- understanding of physical processes that enable the EDS technique and data evaluation algorithms;
- hand-on experience of data acquisition and evaluation routines including
o practical understanding of different data acquisition set-ups,
o optimization of acquisition parameters for most reliable quantification of the results,
o the knowledge of the available and most reliable quantification algorithms and their handling
o the knowledge of data evaluation routines and possible handicaps for reliable elemental content distribution analyses and material composition quantification
o the effect of the specimen geometry on the data and experimental solutions for minimization of the artefacts
InhaltThis advanced course provides analytical EM techniques to the students with prior EM experience (TEM or SEM). At the end of the course, students will understand the physical processes that enable the EDS technique and data evaluation algorithms and apply the technique for their own research.
- Introduction to analytical electron microscopy: theory and instrumentation.
- Lectures on EDS, WDS
- Practical on EDS-SEM: data acquisition and analysis.
- Practical on EDS-TEM: data acquisition and analysis.
The hand-on trainings are to be carried-out on a real-life specimen, provided by lecturers and / by students.
SkriptProvided in the course Moodle-page
Literatur- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM. Springer Verlag, 2007
- Williams & Carter: Transmission Electron Microscopy: A Textbook for Material Sciences. Plenum Press, 2nd Edition 2009, ISBD: 0 306 45247-2
- Goodhew, Humphreys & Beanland: Electron Microscopy and Analyses, Third edition. CRC Press, 2000
- Carter & Williams: Transmission Electron Microscopy: Diffraction, Imaging and Spectrometry. Springer Verlag, 2016, DOI: 10.1007/978-3-319-26651-0
- Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press, 2010
Voraussetzungen / Besonderes- Master student or PhD student who has experience with EM (SEM or TEM) techniques or prior attendance of one of the following courses: Microscopy Training SEM1 (327-2125-00L) or Microscopy Training TEM1(327-2126-00L)
- Attendance of the following courses is of advantage, but not required: Scattering Techniques for Material Characterization (327-2137-00L) or Elements of Microscopy (227-0390-00L) or Electron Microscopy in Material Science (327-0703-00L)
327-2140-00LFocused Ion Beam and Applications Belegung eingeschränkt - Details anzeigen
Number of participants limited to 6. PhD students will be asked for a fee. Link

Registration form: (Link)
1 KP2PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler
KurzbeschreibungThe course on Focused Ion Beam (FIB) provides theoretical and hands-on learning, applying what is learned in lectures to hands-on sessions.
Lernziel Overview of FIB theory, instrumentation.
 FIB hardware operation and applications.
 Set-up, align and operate a FIB-SEM successfully and safely.
 Accomplish operational tasks (milling and deposition) and optimize microscope parameters.
 Perform cross-sections: preparation and analysis
 Understanding of workflow for sample preparation (TEM lamella, APT needles, XCT pillars…) using FIB-SEM.
 Applying FIB-SEM for materials characterization.
InhaltThis course provides FIB techniques to students with previous SEM experience. At the end of the course, students will be able to set-up a FIB-SEM session and characterize cross-sections. Students will also understand how to prepare TEM & APT samples and design a FIB experiment to solve research problems.
 Introduction to FIB theory and instrumentation.
 Discussion of FIB operation and applications.
 Lecture and demonstration on FIB automation.
 Practicals on FIB-SEM set-up and alignment.
 Practicals on cross-section and site-specific sample characterization.
 Practicals on sample preparation (TEM lamella/APT needles).
SkriptLecture notes will be distributed.
Literatur Reyntjens, Steve & Puers, Robert. (2001). A review of focused ion beam applications in microsystem technology. J. Micromech. Microeng. J. Micromech. Microeng. 1157. 287-300. http://doi.org/10.1088/0960-1317/11/4/301.
 Yao, Nan ed.: Focused Ion Beam systems: Basics and Applications, Cambridge, 2007.
Voraussetzungen / BesonderesThe students should fulfil one or more of these prerequisites:
 Prior attendance to the ScopeM Microscopy Training SEM I: Introduction to SEM (327-2125-00L)
 Prior SEM experience.
651-1851-00LIntroduction to Scanning Electron Microscopy1 KP2GL. Grafulha Morales, J. Allaz, K. Kunze
KurzbeschreibungEinführung in die Rasterelektronenmikroskopie und Mikrobereichsanalyse. Erwerb praktischer Fertigkeiten in der selbständigen Bedienung eines REM.
LernzielEinführung in die Rasterelektronenmikroskopie und Mikrobereichsanalyse. Erwerb praktischer Fertigkeiten in der selbständigen Bedienung eines REM.
InhaltFunktionsweise und die wesentlichen Betriebsarten eines Rasterelektronenmikroskopes. Methoden und Einsatzzwecke zur
- Abbildung (SE, BSE, FSE, AE, KL),
- Röntgen-Spektroskopie (EDX),
- Elektronen-Beugung (EBSD, Channeling, Orientation Imaging).
Methoden zur Probenpräparation.
Praktische Übungen
SkriptBeilagen und Bedienungsunterlagen werden während des Kurses abgegeben
Literatur- Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996).
- Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994).
- Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973).
- Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981).
Voraussetzungen / BesonderesGanztägiger Blockkurs nach Ende des HS