Robin Schäublin: Katalogdaten im Frühjahrssemester 2021

NameHerr Dr. Robin Schäublin
Adresse
Metallphysik und Technologie
ETH Zürich, HCI J 490.2
Vladimir-Prelog-Weg 1-5/10
8093 Zürich
SWITZERLAND
Telefon+41 44 633 25 27
Fax+41 44 633 14 21
E-Mailrobin.schaeublin@scopem.ethz.ch
DepartementMaterialwissenschaft
BeziehungDozent

NummerTitelECTSUmfangDozierende
327-2128-00LHigh Resolution Transmission Electron Microscopy Belegung eingeschränkt - Details anzeigen
Limited number of participants.
More information here: Link
2 KP3GA. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng
KurzbeschreibungDieser Fortgeschrittenenkurs für hochauflösende Transmissionselektronenmikroskopie (HRTEM) bietet Vorlesungen, die sich auf HRTEM- und HRSTEM-Bildgebungsprinzipien, die zugehörige Datenanalyse und Simulation, sowie Phasenwiederherstellungsmethoden konzentrieren.
Lernziel- Learning how HRTEM and HRSTEM images are obtained.
- Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them.
- Learning about TEM and STEM images simulation software.
- Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).
InhaltThis course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them.

Topics:
1. Introduction to HRTEM and HRSTEM
2. Considerations on (S)TEM instrumentation for high resolution imaging
3. Lectures on aberrations, aberration correction and aberration corrected images
4. HRTEM and HRSTEM simulation
5. Data analysis, phase restoration and lattice-strain analysis
Literatur- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009
- Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016
- Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015.
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM TEM basic course
- Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science)
- Prior TEM experience