Joakim Reuteler: Katalogdaten im Herbstsemester 2019 |
| Name | Herr Dr. Joakim Reuteler |
| Adresse | ScopeM ETH Zürich, HPM D 47 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telefon | +41 44 633 69 91 |
| joakim.reuteler@scopem.ethz.ch | |
| URL | http://www.emez.ethz.ch/people/senresearchers/rjoakim |
| Departement | Materialwissenschaft |
| Beziehung | Dozent |
| Nummer | Titel | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|
| 327-0702-00L | EM-Practical Course in Materials Science | 2 KP | 4P | K. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler | |
| Kurzbeschreibung | Praktische Arbeit am TEM und SEM, selbständiges Bearbeiten von typischen Fragestellungen, Auswertung der Daten, Schreiben eines Reports und Lernjournal | ||||
| Lernziel | Anwendung grundlegender elektronenmikroskopischer Techniken im Bereich materialwissenschaftlicher Fragestellungen | ||||
| Literatur | siehe LE Electron Microscopy (327-0703-00L) | ||||
| Voraussetzungen / Besonderes | Besuch der LE Electron Microscopy (327-0703-00L) wird empfohlen. Maximale Teilnehmerzahl 15, Arbeit in 3-er Gruppen. | ||||
| 327-2125-00L | Microscopy Training SEM I - Introduction to SEM  The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (http://www.scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | 2 KP | 3P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler | |
| Kurzbeschreibung | Der Einführungskurs in Rasterelektronenmikroskopie (SEM) betont praktisches Lernen. Die Studierenden haben die Möglichkeit an zwei Elektronenmikroskopen ihre eigenen Proben oder Standard-Testproben zu untersuchen, sowie von ScopeM-Wissenschafler vorbereitete Übungen zu lösen. | ||||
| Lernziel | - Set-up, align and operate a SEM successfully and safely. - Accomplish imaging tasks successfully and optimize microscope performances. - Master the operation of a low-vacuum and field-emission SEM and EDX instrument. - Perform sample preparation with corresponding techniques and equipment for imaging and analysis - Acquire techniques in obtaining secondary electron and backscatter electron micrographs - Perform EDX qualitative and semi-quantitative analysis | ||||
| Inhalt | During the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications. This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized. - Discussion of students' sample/interest - Introduction and discussion on Electron Microscopy and instrumentation - Lectures on electron sources, electron lenses and probe formation - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM - Brief description and demonstration of the SEM microscope - Practice on beam/specimen interaction, image formation, image contrast (and image processing) - Student participation on sample preparation techniques - Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities - Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping - Practice on real-world samples and report results | ||||
| Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
| Voraussetzungen / Besonderes | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | ||||