Fabian Gramm: Lehrveranstaltungen im Herbstsemester 2019 |
Name | Herr Dr. Fabian Gramm |
Adresse | ScopeM ETH Zürich, HPM D 46 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
Telefon | +41 44 633 39 09 |
fabian.gramm@scopem.ethz.ch | |
Departement | Materialwissenschaft |
Beziehung | Dozent |
Nummer | Titel | ECTS | Umfang | Dozierende | ||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
327-0702-00L | EM-Practical Course in Materials Science | 2 KP | 4P | |||||||||||||||||
327-0702-00 P | EM-Practical in Materials Science Das Praktikum findet vom 13. bis 17. Januar 2020 ganztags in den Laborräumen des ScopeM (ETH Hönggerberg) statt. | 60s Std. | K. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler | |||||||||||||||||
327-0703-00L | Electron Microscopy in Material Science | 4 KP | 2V + 2U | |||||||||||||||||
327-0703-00 V | Electron Microscopy in Materials Science | 2 Std. |
| K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger | ||||||||||||||||
327-0703-00 U | Electron Microscopy in Materials Science | 2 Std. |
| K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger | ||||||||||||||||
327-2126-00L | Microscopy Training TEM I - Introduction to TEM The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (http://www.scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | 2 KP | 3P | |||||||||||||||||
327-2126-00 P | Microscopy Training TEM I - Introduction to TEM Block course: 28.10.19- 01.11.19. On October 31 and November 1 only in rooms of ScopeM. The repetition of this course will take place from 2.12. - 6.12.2019. On Wednesday, Thursday and Friday only in rooms of ScopeM. | 35s Std. |
| P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, M. Willinger |