Karsten Kunze: Katalogdaten im Herbstsemester 2019 |
| Name | Herr Dr. Karsten Kunze |
| Adresse | ScopeM ETH Zürich, HPM D 46 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telefon | +41 44 632 56 95 |
| karsten.kunze@scopem.ethz.ch | |
| Departement | Erd- und Planetenwissenschaften |
| Beziehung | Dozent |
| Nummer | Titel | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|
| 327-0702-00L | EM-Practical Course in Materials Science | 2 KP | 4P | K. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler | |
| Kurzbeschreibung | Praktische Arbeit am TEM und SEM, selbständiges Bearbeiten von typischen Fragestellungen, Auswertung der Daten, Schreiben eines Reports und Lernjournal | ||||
| Lernziel | Anwendung grundlegender elektronenmikroskopischer Techniken im Bereich materialwissenschaftlicher Fragestellungen | ||||
| Literatur | siehe LE Electron Microscopy (327-0703-00L) | ||||
| Voraussetzungen / Besonderes | Besuch der LE Electron Microscopy (327-0703-00L) wird empfohlen. Maximale Teilnehmerzahl 15, Arbeit in 3-er Gruppen. | ||||
| 327-0703-00L | Electron Microscopy in Material Science | 4 KP | 2V + 2U | K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger | |
| Kurzbeschreibung | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
| Lernziel | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
| Inhalt | This course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported. | ||||
| Skript | will be distributed in English | ||||
| Literatur | Goodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000 Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014 Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013 Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008 Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015) | ||||
| 327-2125-00L | Microscopy Training SEM I - Introduction to SEM  The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (http://www.scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | 2 KP | 3P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler | |
| Kurzbeschreibung | Der Einführungskurs in Rasterelektronenmikroskopie (SEM) betont praktisches Lernen. Die Studierenden haben die Möglichkeit an zwei Elektronenmikroskopen ihre eigenen Proben oder Standard-Testproben zu untersuchen, sowie von ScopeM-Wissenschafler vorbereitete Übungen zu lösen. | ||||
| Lernziel | - Set-up, align and operate a SEM successfully and safely. - Accomplish imaging tasks successfully and optimize microscope performances. - Master the operation of a low-vacuum and field-emission SEM and EDX instrument. - Perform sample preparation with corresponding techniques and equipment for imaging and analysis - Acquire techniques in obtaining secondary electron and backscatter electron micrographs - Perform EDX qualitative and semi-quantitative analysis | ||||
| Inhalt | During the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications. This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized. - Discussion of students' sample/interest - Introduction and discussion on Electron Microscopy and instrumentation - Lectures on electron sources, electron lenses and probe formation - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM - Brief description and demonstration of the SEM microscope - Practice on beam/specimen interaction, image formation, image contrast (and image processing) - Student participation on sample preparation techniques - Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities - Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping - Practice on real-world samples and report results | ||||
| Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
| Voraussetzungen / Besonderes | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | ||||
| 651-1851-00L | Einführung in die Rasterelektronenmikroskopie | 1 KP | 2G | K. Kunze, J. Allaz, L. Grafulha Morales | |
| Kurzbeschreibung | Einführung in die Rasterelektronenmikroskopie und Mikrobereichsanalyse. Erwerb praktischer Fertigkeiten in der selbständigen Bedienung eines REM. | ||||
| Lernziel | Einführung in die Rasterelektronenmikroskopie und Mikrobereichsanalyse. Erwerb praktischer Fertigkeiten in der selbständigen Bedienung eines REM. | ||||
| Inhalt | Funktionsweise und die wesentlichen Betriebsarten eines Rasterelektronenmikroskopes. Methoden und Einsatzzwecke zur - Abbildung (SE, BSE, FSE, AE, KL), - Röntgen-Spektroskopie (EDX), - Elektronen-Beugung (EBSD, Channeling, Orientation Imaging). Methoden zur Probenpräparation. Praktische Übungen | ||||
| Skript | Beilagen und Bedienungsunterlagen werden während des Kurses abgegeben | ||||
| Literatur | - Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996). - Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994). - Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973). - Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981). | ||||
| Voraussetzungen / Besonderes | Ganztägiger Blockkurs nach Ende des HS | ||||