Sung Sik Lee: Catalogue data in Spring Semester 2023

Name Dr. Sung Sik Lee
ETH Zürich, HPM C 52.2
Otto-Stern-Weg 3
8093 Zürich
Telephone+41 44 633 44 30

327-0413-00LMaterials Characterization II4 credits4GR. Erni, S. Gerstl, A. Hrabec, S. S. Lee, V. Scagnoli, M. Trassin, T. Weber, P. Zeng
AbstractThe main aim of the course is to enable the students to independently choose a suitable material characterization methods to address a specific materials science question. Subject areas are: light microscopy, diffraction methods (X-rays, neutrons, electrons), electron microscopy, atom probe tomography and atomic force microscopy. Depending on lecturer, lectures and practicals in German or English.
Objective- Being able to explain the fundamentals of basic and advanced materials characterization methods based on microscopy and diffraction modalities.

- Being able to identify and solve practical problems of selected characterization methods based on corresponding laboratory work.

- Being able to advice non-experts why, how and when these methods can be used to assess what type of information, and to draw awareness to possible problems and limitations of these methods.
ContentIn the first part of the semester, different lecturers will present the fundamentals of the materials characterization methods mentioned above. This is the lecture part of the course. In the second half of the semester, the students, grouped in teams, will apply selected methods. These laboratory works are at the heart of the course, where the students are faced with practical problems and the limitations of the different methods, and where they have to independently elaborate solutions within the teams. Special: some practical courses are offered at the Paul Scherrer Institute, where the students can make use of the neutron and synchrotron X-ray facilities. These courses will take place after the end of the semester and occupy half and full days.
Lecture notes- Slides of the lectures (in English) will be distributed electronically.
- Depending on the laboratory course, additional documentation will be made available.
- In laboratory journals, the students are asked to compose their own documentation of the laboratory courses.
Literature- B. Fultz, J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed., Springer, 2009.
- P. Willmott, An Introduction to Synchrotron Radiation: Techniques and Applications, Wiley, 2011.
Prerequisites / NoticeMaterials Characterization I
Subject-specific CompetenciesConcepts and Theoriesassessed
Techniques and Technologiesassessed
Method-specific CompetenciesAnalytical Competenciesfostered
Media and Digital Technologiesfostered
Project Managementfostered
Social CompetenciesCommunicationassessed
Cooperation and Teamworkassessed
Customer Orientationfostered
Leadership and Responsibilityfostered
Self-presentation and Social Influence fostered
Sensitivity to Diversityfostered
Personal CompetenciesAdaptability and Flexibilityfostered
Creative Thinkingassessed
Critical Thinkingassessed
Integrity and Work Ethicsfostered
Self-awareness and Self-reflection fostered
Self-direction and Self-management assessed