Peng Zeng: Lerneinheiten im Herbstsemester 2022 |
| Name | Frau Dr. Peng Zeng |
| Adresse | ScopeM ETH Zürich, HPM D 48 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telefon | +41 44 633 80 34 |
| peng.zeng@scopem.ethz.ch | |
| Departement | Materialwissenschaft |
| Beziehung | Dozentin |
| Nummer | Titel | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|
| 327-2125-00L | Microscopy Training SEM I - Introduction to SEM  The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (https://scopem.ethz.ch/education/MTP0.html). All applicants must additionally register on this form: (link will follow) The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | 2 KP | 3P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, F. Lucas, J. Reuteler | |
| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (https://scopem.ethz.ch/education/MTP0.html). All applicants must additionally register on this form: (link will follow) The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | 2 KP | 3P | P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko | |
| 327-2128-00L | High Resolution Transmission Electron Microscopy Limited number of participants. More information here: https://scopem.ethz.ch/education/MTP0.html | 2 KP | 3G | A. Sologubenko, R. Erni, R. Schäublin, P. Zeng | |
| 327-2140-00L | Focused Ion Beam and Applications Number of participants limited to 6. PhD students will be asked for a fee. https://scopem.ethz.ch/education/MTP0.html Registration form: (link will follow) | 1 KP | 2P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler | |
| 327-2144-00L | Microscopy Training Cryogenic Electron Microscopy | 1 KP | 2P | M. Peterek, B. Qureshi, E. J. Barthazy Meier, S. Handschin, M. S. Lucas-Droste, P. Zeng | |