Marc Willinger: Catalogue data in Spring Semester 2022 |
| Name | Dr. Marc Willinger |
| Department | Materials |
| Relationship | Lecturer |
| Number | Title | ECTS | Hours | Lecturers | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| 327-0413-00L | Materials Characterization II | 4 credits | 4G | R. Erni, S. Gerstl, A. Hrabec, V. Scagnoli, M. Trassin, T. Weber, M. Willinger | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Abstract | The main aim of the course is to enable the students to independently choose a suitable material characterization methods to address a specific materials science question. Subject areas are: light microscopy, diffraction methods (X-rays, neutrons, electrons), electron microscopy, atom probe tomography and atomic force microscopy. Depending on lecturer, lectures and practicals in German or English. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Learning objective | - Being able to explain the fundamentals of basic and advanced materials characterization methods based on microscopy and diffraction modalities. - Being able to identify and solve practical problems of selected characterization methods based on corresponding laboratory work. - Being able to advice non-experts why, how and when these methods can be used to assess what type of information, and to draw awareness to possible problems and limitations of these methods. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Content | In the first part of the semester, different lecturers will present the fundamentals of the materials characterization methods mentioned above. This is the lecture part of the course. In the second half of the semester, the students, grouped in teams, will apply selected methods. These laboratory works are at the heart of the course, where the students are faced with practical problems and the limitations of the different methods, and where they have to independently elaborate solutions within the teams. Special: some practical courses are offered at the Paul Scherrer Institute, where the students can make use of the neutron and synchrotron X-ray facilities. These courses will take place after the end of the semester and occupy full days. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Lecture notes | - Slides of the lectures (in English) will be distributed electronically. - Depending on the laboratory course, additional documentation will be made available. - In laboratory journals, the students are asked to compose their own documentation of the laboratory courses. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Literature | - B. Fultz, J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed., Springer, 2009. - P. Willmott, An Introduction to Synchrotron Radiation: Techniques and Applications, Wiley, 2011. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Prerequisites / Notice | Materials Characterization I | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Competencies |
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| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM  Number of participants limited to 6. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee (http://www.scopem.ethz.ch/education/MTP.html). TEM 1 registration form: (Link) | 2 credits | 3P | P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Abstract | The introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations, and hands-on sessions. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Learning objective | - Overview of TEM theory, instrumentation, operation and applications. - Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully. - Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras. - To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns. - Overview of techniques for specimen preparation. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Content | Using two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods. - Introduction and discussion on Electron Microscopy and instrumentation. - Lectures on electron sources, electron lenses and probe formation. - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM. - Brief description and demonstration of the TEM microscope. - Practice on beam/specimen interaction, image formation, Image contrast (and image processing). - Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM). - Student participation on sample preparation techniques. - Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities. - TEM alignment, calibration, correction to improve image contrast and quality. - Electron diffraction. - Practice on real-world samples and report results. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Literature | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Prerequisites / Notice | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||