Tino Wagner: Catalogue data in Spring Semester 2018

Name Dr. Tino Wagner
DepartmentMechanical and Process Engineering
RelationshipLecturer

NumberTitleECTSHoursLecturers
151-0622-00LMeasuring on the Nanometer Scale2 credits2GA. Stemmer, T. Wagner
AbstractIntroduction to theory and practical application of measuring techniques suitable for the nano domain.
ObjectiveIntroduction to theory and practical application of measuring techniques suitable for the nano domain.
ContentConventional techniques to analyze nano structures using photons and electrons: light microscopy with dark field and differential interference contrast; scanning electron microscopy, transmission electron microscopy. Interferometric and other techniques to measure distances. Optical traps. Foundations of scanning probe microscopy: tunneling, atomic force, optical near-field. Interactions between specimen and probe. Current trends, including spectroscopy of material parameters.
Lecture notesClass notes and special papers will be distributed.
151-0628-00LScanning Probe Microscopy Lab Restricted registration - show details
Limited number of participants.
Please address your application to Andreas Stemmer (Link).

Simultaneous enrolment in 151-0622-00L Measuring on the Nanometer Scale is required.
2 credits2PA. Stemmer, T. Wagner
AbstractPractical application of scanning probe microscopy techniques in the field of nanoscale and molecular electronics. Limited access.
ObjectiveDesign, realisation, evaluation, and interpretation of experiments in scanning probe microscopy.
Prerequisites / NoticeApplication required! The number of participants is limited.

Enrollment in the Master course 151-0622-00L Measuring on the Nanometer Scale is required.

Applications include (i) a summary of your research experience in micro and nanoscale science, (ii) a short description of your goals for the next three years, and (iii) a statement of what you personally expect to gain from attending this course.
Send applications to Andreas Stemmer astemmer@ethz.ch