Tino Wagner: Katalogdaten im Frühjahrssemester 2018
|Name||Herr Dr. Tino Wagner|
|Departement||Maschinenbau und Verfahrenstechnik|
|151-0622-00L||Measuring on the Nanometer Scale||2 KP||2G||A. Stemmer, T. Wagner|
|Kurzbeschreibung||Introduction to theory and practical application of measuring techniques suitable for the nano domain.|
|Lernziel||Introduction to theory and practical application of measuring techniques suitable for the nano domain.|
|Inhalt||Conventional techniques to analyze nano structures using photons and electrons: light microscopy with dark field and differential interference contrast; scanning electron microscopy, transmission electron microscopy. Interferometric and other techniques to measure distances. Optical traps. Foundations of scanning probe microscopy: tunneling, atomic force, optical near-field. Interactions between specimen and probe. Current trends, including spectroscopy of material parameters.|
|Skript||Class notes and special papers will be distributed.|
|151-0628-00L||Scanning Probe Microscopy Lab |
Limited number of participants.
Please address your application to Andreas Stemmer (email@example.com).
Simultaneous enrolment in 151-0622-00L Measuring on the Nanometer Scale is required.
|2 KP||2P||A. Stemmer, T. Wagner|
|Kurzbeschreibung||Practical application of scanning probe microscopy techniques in the field of nanoscale and molecular electronics. Limited access.|
|Lernziel||Design, realisation, evaluation, and interpretation of experiments in scanning probe microscopy.|
|Voraussetzungen / Besonderes||Application required! The number of participants is limited.|
Enrollment in the Master course 151-0622-00L Measuring on the Nanometer Scale is required.
Applications include (i) a summary of your research experience in micro and nanoscale science, (ii) a short description of your goals for the next three years, and (iii) a statement of what you personally expect to gain from attending this course.
Send applications to Andreas Stemmer firstname.lastname@example.org