Andres Käch: Catalogue data in Autumn Semester 2020 |
| Name | Dr. Andres Käch |
| Address | Universität Zürich Winterthurerstrasse 190 Zentr f. Mikroskopie u.Bildanalyse 8057 Zürich SWITZERLAND |
| Telephone | +41 76 377 30 51 |
| kaecha@ethz.ch | |
| Department | Materials |
| Relationship | Lecturer |
| Number | Title | ECTS | Hours | Lecturers | |
|---|---|---|---|---|---|
| 327-0703-00L | Electron Microscopy in Material Science | 4 credits | 2V + 2U | K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger | |
| Abstract | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
| Learning objective | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
| Content | This course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported. | ||||
| Lecture notes | will be distributed in English | ||||
| Literature | Goodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000 Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014 Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013 Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008 Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015) | ||||