Robin Schäublin: Catalogue data in Autumn Semester 2020

Name Dr. Robin Schäublin
Metallphysik und Technologie
ETH Zürich, HCI J 490.2
Vladimir-Prelog-Weg 1-5/10
8093 Zürich
Telephone+41 44 633 25 27
Fax+41 44 633 14 21

327-0301-00LMaterials Science I
Planned to be offered for the last time in HS 2020.
3 credits3GJ. F. Löffler, R. Schäublin, A. R. Studart
AbstractBasic concepts of metal physics and ceramics, plus their related technologies.
ObjectiveBased on the lecture 'Introduction to Materials Science' this lecture aims to give a detailed understanding of important aspects in materials science, with special emphasis on metallic and ceramic materials.
ContentThermodynamics and phase diagrams, crystal interfaces and microstructure, diffusional transformations in solids, and diffusionless transformations will be presented for metallic alloys.
The basics of the ionic and covalent chemical bonds, the bond energy, the crystalline structure, four important structural ceramics, and the properties of glasses and glass ceramics will be presented for ceramic materials.
Lecture notesFor metals see:

For ceramics see:
D. A. Porter, K. E. Easterling
Phase Transformations in Metals and Alloys - Second Edition
ISBN : 0-7487-5741-4
Nelson Thornes

- Munz, D.; Fett, T: Ceramics, Mechanical Properties, Failure Behaviour, Materials Selection,
- Askeland & Phulé: Science and Engineering of Materials, 2003
- diverse CEN ISO Standards given in the slides
- Barsoum MW: Fundamentals of Ceramics:
- Chiang, Y.M.; Dunbar, B.; Kingery, W.D; Physical Ceramics, Principles für Ceramic Science and Engineering. Wiley , 1997
- Hannik, Kelly, Muddle: Transformation Toughening in Zirconia Containing Ceramics, J Am Ceram Soc 83 [3] 461-87 (2000)
- "High-Tech Ceramics: viewpoints and perspectives", ed G. Kostorz, Academic Press, 1989. Chapter 5, 59-101.

- "Brevieral Ceramics" published by the "Verband der Keramischen Industrie e.V.", ISBN 3-924158-77-0. partly its contents may be found in the internet @ or on our homepage

- Silicon-Based Structural Ceramics (Ceramic Transactions), Stephen C. Danforth (Editor), Brian W. Sheldon, American Ceramic Society, 2003,

- Silicon Nitride-1, Shigeyuki Somiya (Editor), M. Mitomo (Editor), M. Yoshimura (Editor), Kluwer Academic Publishers, 1990 3. Zirconia and Zirconia Ceramics. Second Edition, Stevens, R, Magnesium Elektron Ltd., 1986, pp. 51, 1986

- Stabilization of the tetragonal structure in zirconia microcrystals, RC Garvie, The Journal of Physical Chemistry, 1978

- Phase relationships in the zirconia-yttria system, HGM Scott - Journal of Materials Science, 1975, Springer

- Thommy Ekström and Mats Nygren, SiAION Ceramics J Am Cer Soc Volume 75 Page 259 - February 1992

- "Formation of beta -Si sub 3 N sub 4 solid solutions in the system Si, Al, O, N by reaction sintering--sintering of an Si sub 3 N sub 4 , AlN, Al sub 2 O sub 3 mixture" Boskovic, L J; Gauckler, L J, La Ceramica (Florence). Vol. 33, no. N-2, pp. 18-22. 1980.

- Alumina: Processing, Properties, and Applications, Dorre, E; Hubner, H, Springer-Verlag, 1984, pp. 329, 1984 9.
Prerequisites / Notice- In the first part of the lecture the basic principles of physical metallurgy will be taught. In the second part the basics of ceramics will be presented.
- Most parts of the lecture will be taught in English.
327-2128-00LHigh Resolution Transmission Electron Microscopy Restricted registration - show details 2 credits3GA. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng
AbstractThis advanced course on High Resolution Transmission Electron Microscopy (HRTEM) provides lectures focused on HRTEM and HRSTEM imaging principles, related data analysis and simulation and phase restoration methods.
Objective- Learning how HRTEM and HRSTEM images are obtained.
- Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them.
- Learning about TEM and STEM images simulation software.
- Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).
ContentThis course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them.

1. Introduction to HRTEM and HRSTEM
2. Considerations on (S)TEM instrumentation for high resolution imaging
3. Lectures on aberrations, aberration correction and aberration corrected images
4. HRTEM and HRSTEM simulation
5. Data analysis, phase restoration and lattice-strain analysis
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009
- Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016
- Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015.
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM TEM basic course
- Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science)
- Prior TEM experience