Robin Schäublin: Katalogdaten im Frühjahrssemester 2020

NameHerr Dr. Robin Schäublin
Metallphysik und Technologie
ETH Zürich, HCI J 490.2
Vladimir-Prelog-Weg 1-5/10
8093 Zürich
Telefon+41 44 633 25 27
Fax+41 44 633 14 21

327-2135-00LAdvanced Analytical TEM Belegung eingeschränkt - Details anzeigen
Number of participants limited to 12.
Master students will have priority over PhD students. More information here: Link
2 KP3GA. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng
KurzbeschreibungThe course focuses on the fundamental understanding and hands-on knowledge of analytical Transmission Electron Microscopy (ATEM) techniques: electron dispersive X-ray analysis (EDX), energy filtered TEM and electron energy loss spectroscopy (EELS). The lectures will be followed by demonstrations and acquisition sessions TEM instruments.The lectures on statistical treatment of raw data sets and on
Lernziel• Setting-up the optimal operation conditions for reliable EDX analysis and quantification.
• Setting-up the optimal operation conditions for the reliable EFTEM analyses.
• Setting-up the optimal operation conditions for the reliable EELS analyses.
• EDX data acquisition, on-line analysis and quantification.
• EFTEM data acquisition and analysis.
• EELS acquisition analyses.
Inhalt1. Fundamentals of analytical TEM.
2. Electron Optics and Instrumentation. Spectrum Imaging.
3. Quantitative X-ray Spectrometry.
4. EELS.
6. Statistical treatment of raw data.
7. EDX. Quantification and data evaluation.
8. Demonstrations on EDX, EELS, and EFTEM data acquisitions.
9. Practical sessions for students with provided specimens. Practical sessions for
students with their own specimens.
10. Questions and such: open discussion.
11. Student presentations.
Literatur• Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
• Williams, Carter: Transmission Electron Microscopy, Plenum Press, 2nd Edition 2009
• Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscopy, 3rd Edition,
Springer, 2011.
Voraussetzungen / BesonderesNo mandatory prerequisites. Prior attendance to EM Basic lectures (327-0703-00L, 227- 0390-00L) and to the Microscopy Training TEM I - Introduction to TEM course (327-2126- 00L) is recommended.