Anne Greet Bittermann: Catalogue data in Autumn Semester 2020

Name Dr. Anne Greet Bittermann
Address
ScopeM
ETH Zürich, HPM D 48
Otto-Stern-Weg 3
8093 Zürich
SWITZERLAND
Telephone+41 44 633 33 04
Fax+41 44 632 11 03
E-mailannegreet.bittermann@scopem.ethz.ch
DepartmentMaterials
RelationshipLecturer

NumberTitleECTSHoursLecturers
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Restricted registration - show details
The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list.

For PhD students, postdocs and others, a fee will be charged (Link).

All applicants must additionally register on this form: Link
The selected applicants will be contacted and asked for confirmation a few weeks before the course date.
2 credits3PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler
AbstractThis introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using ScopeM SEMs, students have the opportunity to study their own samples (or samples provided) and solve practical problems by applying knowledge acquired during the lectures. At the end of the course, students will be able to apply SEM for their (future) research projects.
Objective- Set-up, align and operate a SEM successfully and safely.
- Understand important operational parameters of SEM and optimize microscope performance.
- Explain different signals in SEM and obtain secondary electron (SE) and backscatter electron (BSE) images.
- Operate the SEM in low-vacuum mode.
- Make use of EDX for semi-quantitative elemental analysis.
- Prepare samples with different techniques and equipment for imaging and analysis by SEM.
ContentDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students are able to align an SEM, to obtain secondary electron (SE) and backscatter electron (BSE) images and to perform energy dispersive X-ray spectroscopy (EDX) semi-quantitative analysis. Emphasis is put on procedures to optimize SEM parameters in order to best solve practical problems and deal with a wide range of materials.

Lectures:
- Introduction on Electron Microscopy and instrumentation
- electron sources, electron lenses and probe formation
- beam/specimen interaction, image formation, image contrast and imaging modes.
- sample preparation techniques for EM
- X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescan and spectral mapping

Practicals:
- Brief description and demonstration of the SEM microscope
- Practice on image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Practice on real-world samples and report results
Lecture notesLecture notes will be distributed.
Literature- Peter Goodhew, John Humphreys, Richard Beanland: Electron Microscopy and Analysis, 3rd ed., CRC Press, 2000
- Joseph Goldstein, et al, Scanning Electron Microscopy and X-Ray Microanalysis, 4th ed, Srpinger US, 2018
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeNo mandatory prerequisites.
327-2126-00LMicroscopy Training TEM I - Introduction to TEM Restricted registration - show details
The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list.

For PhD students, postdocs and others, a fee will be charged (Link).

All applicants must additionally register on this form: Link
The selected applicants will be contacted and asked for confirmation a few weeks before the course date.
2 credits3PP. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger
AbstractThe introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for beginners who are interested in using TEM for their Master or PhD thesis. TEM sample preparation techniques are also discussed. During hands-on sessions at different TEM instruments, students will have the opportunity to examine their own samples if time allows.
ObjectiveUnderstanding of
1. the set-up and individual components of a TEM
2. the basics of electron optics and image formation
3. the basics of electron beam – sample interactions
4. the contrast mechanism
5. various sample preparation techniques
Learning how to
1. align and operate a TEM
2. acquire data using different operation modes of a TEM instrument, i.e. Bright-field and Dark-field imaging
3. record electron diffraction patterns and index diffraction patterns
4. interpret TEM data
ContentLectures:
- basics of electron optics and the TEM instrument set-up
- TEM imaging modes and image contrast
- STEM operation mode
- Sample preparation techniques for hard and soft materials

Practicals:
- Demo, practical demonstration of a TEM: instrument components, alignment, etc.
- Hands-on training for students: sample loading, instrument alignment and data acquisition.
- Sample preparation for different types of materials
- Practical work with TEMs
- Demonstration of advanced Transmission Electron Microscopy techniques
Lecture notesLecture notes will be distributed.
Literature- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551-1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
327-2140-00LFocused Ion Beam and Applications Restricted registration - show details
Number of participants limited to 6. PhD students will be asked for a fee. Link

Registration form: (Link)
1 credit2PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler
AbstractThe course on Focused Ion Beam (FIB) provides theoretical and hands-on learning, applying what is learned in lectures to hands-on sessions.
Objective Overview of FIB theory, instrumentation.
 FIB hardware operation and applications.
 Set-up, align and operate a FIB-SEM successfully and safely.
 Accomplish operational tasks (milling and deposition) and optimize microscope parameters.
 Perform cross-sections: preparation and analysis
 Understanding of workflow for sample preparation (TEM lamella, APT needles, XCT pillars…) using FIB-SEM.
 Applying FIB-SEM for materials characterization.
ContentThis course provides FIB techniques to students with previous SEM experience. At the end of the course, students will be able to set-up a FIB-SEM session and characterize cross-sections. Students will also understand how to prepare TEM & APT samples and design a FIB experiment to solve research problems.
 Introduction to FIB theory and instrumentation.
 Discussion of FIB operation and applications.
 Lecture and demonstration on FIB automation.
 Practicals on FIB-SEM set-up and alignment.
 Practicals on cross-section and site-specific sample characterization.
 Practicals on sample preparation (TEM lamella/APT needles).
Lecture notesLecture notes will be distributed.
Literature Reyntjens, Steve & Puers, Robert. (2001). A review of focused ion beam applications in microsystem technology. J. Micromech. Microeng. J. Micromech. Microeng. 1157. 287-300. http://doi.org/10.1088/0960-1317/11/4/301.
 Yao, Nan ed.: Focused Ion Beam systems: Basics and Applications, Cambridge, 2007.
Prerequisites / NoticeThe students should fulfil one or more of these prerequisites:
 Prior attendance to the ScopeM Microscopy Training SEM I: Introduction to SEM (327-2125-00L)
 Prior SEM experience.