Stephan Gerstl: Katalogdaten im Herbstsemester 2022

NameHerr Dr. Stephan Gerstl
NamensvariantenStephan Gerstl
SSA Gerstl
Stephan S A Gerstl
ETH Zürich, HPM D 47
Otto-Stern-Weg 3
8093 Zürich
Telefon+41 44 633 69 54

327-0702-00LEM-Practical Course in Materials Science2 KP4PK. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler
KurzbeschreibungPraktische Arbeit an TEM, SEM, FIB und APT
selbständiges Bearbeiten von typischen Fragestellungen
Auswertung der Daten, Schreiben eines Reports
LernzielAnwendung grundlegender elektronenmikroskopischer Techniken im Bereich materialwissenschaftlicher Fragestellungen
Literatursiehe LE Electron Microscopy (327-0703-00L)
Voraussetzungen / BesonderesBesuch der LE Electron Microscopy (327-0703-00L) wird empfohlen.
Maximale Teilnehmerzahl 15, Arbeit in 3-er Gruppen.
327-0703-00LElectron Microscopy in Material Science4 KP2V + 2US. Gerstl, R. Erni, F. Gramm, A. Käch, F. Krumeich, K. Kunze
KurzbeschreibungA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
LernzielA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
InhaltThis course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported.
Skriptwill be distributed in English
LiteraturGoodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000
Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014
Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013
Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008
Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015)
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Belegung eingeschränkt - Details anzeigen
The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list.

For PhD students, postdocs and others, a fee will be charged (Link).

All applicants must additionally register on this form: (link will follow)
The selected applicants will be contacted and asked for confirmation a few weeks before the course date.
2 KP3PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, F. Lucas, J. Reuteler
KurzbeschreibungThis introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using ScopeM SEMs, students have the opportunity to study their own samples (or samples provided) and solve practical problems by applying knowledge acquired during the lectures. At the end of the course, students will be able to apply SEM for their (future) research projects.
Lernziel- Set-up, align and operate a SEM successfully and safely.
- Understand important operational parameters of SEM and optimize microscope performance.
- Explain different signals in SEM and obtain secondary electron (SE) and backscatter electron (BSE) images.
- Operate the SEM in low-vacuum mode.
- Make use of EDX for semi-quantitative elemental analysis.
- Prepare samples with different techniques and equipment for imaging and analysis by SEM.
InhaltDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students are able to align an SEM, to obtain secondary electron (SE) and backscatter electron (BSE) images and to perform energy dispersive X-ray spectroscopy (EDX) semi-quantitative analysis. Emphasis is put on procedures to optimize SEM parameters in order to best solve practical problems and deal with a wide range of materials.

- Introduction on Electron Microscopy and instrumentation
- electron sources, electron lenses and probe formation
- beam/specimen interaction, image formation, image contrast and imaging modes.
- sample preparation techniques for EM
- X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescan and spectral mapping

- Brief description and demonstration of the SEM microscope
- Practice on image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Practice on real-world samples and report results
SkriptLecture notes will be distributed.
Literatur- Peter Goodhew, John Humphreys, Richard Beanland: Electron Microscopy and Analysis, 3rd ed., CRC Press, 2000
- Joseph Goldstein, et al, Scanning Electron Microscopy and X-Ray Microanalysis, 4th ed, Srpinger US, 2018
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesNo mandatory prerequisites.
327-2140-00LFocused Ion Beam and Applications Belegung eingeschränkt - Details anzeigen
Number of participants limited to 6. PhD students will be asked for a fee. Link

Registration form: (link will follow)
1 KP2PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler
KurzbeschreibungThe course on Focused Ion Beam (FIB) provides theoretical and hands-on learning, applying what is learned in lectures to hands-on sessions.
Lernziel Overview of FIB theory, instrumentation.
 FIB hardware operation and applications.
 Set-up, align and operate a FIB-SEM successfully and safely.
 Accomplish operational tasks (milling and deposition) and optimize microscope parameters.
 Perform cross-sections: preparation and analysis
 Understanding of workflow for sample preparation (TEM lamella, APT needles, XCT pillars…) using FIB-SEM.
 Applying FIB-SEM for materials characterization.
InhaltThis course provides FIB techniques to students with previous SEM experience. At the end of the course, students will be able to set-up a FIB-SEM session and characterize cross-sections. Students will also understand how to prepare TEM & APT samples and design a FIB experiment to solve research problems.
 Introduction to FIB theory and instrumentation.
 Discussion of FIB operation and applications.
 Lecture and demonstration on FIB automation.
 Practicals on FIB-SEM set-up and alignment.
 Practicals on cross-section and site-specific sample characterization.
 Practicals on sample preparation (TEM lamella/APT needles).
SkriptLecture notes will be distributed.
Literatur Reyntjens, Steve & Puers, Robert. (2001). A review of focused ion beam applications in microsystem technology. J. Micromech. Microeng. J. Micromech. Microeng. 1157. 287-300.
 Yao, Nan ed.: Focused Ion Beam systems: Basics and Applications, Cambridge, 2007.
Voraussetzungen / BesonderesThe students should fulfil one or more of these prerequisites:
 Prior attendance to the ScopeM Microscopy Training SEM I: Introduction to SEM (327-2125-00L)
 Prior SEM experience.