Stephan Gerstl: Catalogue data in Spring Semester 2023

Name Dr. Stephan Gerstl
Name variantsStephan Gerstl
SSA Gerstl
Stephan S A Gerstl
ETH Zürich, HPM D 47
Otto-Stern-Weg 3
8093 Zürich
Telephone+41 44 633 69 54

327-0413-00LMaterials Characterization II4 credits4GR. Erni, S. Gerstl, A. Hrabec, S. S. Lee, V. Scagnoli, M. Trassin, T. Weber, P. Zeng
AbstractThe main aim of the course is to enable the students to independently choose a suitable material characterization methods to address a specific materials science question. Subject areas are: light microscopy, diffraction methods (X-rays, neutrons, electrons), electron microscopy, atom probe tomography and atomic force microscopy. Depending on lecturer, lectures and practicals in German or English.
Objective- Being able to explain the fundamentals of basic and advanced materials characterization methods based on microscopy and diffraction modalities.

- Being able to identify and solve practical problems of selected characterization methods based on corresponding laboratory work.

- Being able to advice non-experts why, how and when these methods can be used to assess what type of information, and to draw awareness to possible problems and limitations of these methods.
ContentIn the first part of the semester, different lecturers will present the fundamentals of the materials characterization methods mentioned above. This is the lecture part of the course. In the second half of the semester, the students, grouped in teams, will apply selected methods. These laboratory works are at the heart of the course, where the students are faced with practical problems and the limitations of the different methods, and where they have to independently elaborate solutions within the teams. Special: some practical courses are offered at the Paul Scherrer Institute, where the students can make use of the neutron and synchrotron X-ray facilities. These courses will take place after the end of the semester and occupy half and full days.
Lecture notes- Slides of the lectures (in English) will be distributed electronically.
- Depending on the laboratory course, additional documentation will be made available.
- In laboratory journals, the students are asked to compose their own documentation of the laboratory courses.
Literature- B. Fultz, J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed., Springer, 2009.
- P. Willmott, An Introduction to Synchrotron Radiation: Techniques and Applications, Wiley, 2011.
Prerequisites / NoticeMaterials Characterization I
Subject-specific CompetenciesConcepts and Theoriesassessed
Techniques and Technologiesassessed
Method-specific CompetenciesAnalytical Competenciesfostered
Media and Digital Technologiesfostered
Project Managementfostered
Social CompetenciesCommunicationassessed
Cooperation and Teamworkassessed
Customer Orientationfostered
Leadership and Responsibilityfostered
Self-presentation and Social Influence fostered
Sensitivity to Diversityfostered
Personal CompetenciesAdaptability and Flexibilityfostered
Creative Thinkingassessed
Critical Thinkingassessed
Integrity and Work Ethicsfostered
Self-awareness and Self-reflection fostered
Self-direction and Self-management assessed
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Restricted registration - show details
Limited number of participants.

Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee. (Link).

Registration form: (Link)
2 credits3PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, F. Lucas, J. Reuteler
AbstractThe introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using 2 SEM instruments, students have the opportunity to study their own samples, or standard test samples, as well as solving exercises provided by ScopeM scientists.
Objective- Set-up, align and operate a SEM successfully and safely.
- Accomplish imaging tasks successfully and optimize microscope performances.
- Master the operation of a low-vacuum and field-emission SEM and EDX instrument.
- Perform sample preparation with corresponding techniques and equipment for imaging and analysis
- Acquire techniques in obtaining secondary electron and backscatter electron micrographs
- Perform EDX qualitative and semi-quantitative analysis
ContentDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized.

- Discussion of students' sample/interest
- Introduction and discussion on Electron Microscopy and instrumentation
- Lectures on electron sources, electron lenses and probe formation
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM
- Brief description and demonstration of the SEM microscope
- Practice on beam/specimen interaction, image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping
- Practice on real-world samples and report results
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
327-2140-00LFocused Ion Beam and Applications Restricted registration - show details
Number of participants limited to 6. PhD students will be asked for a fee. Link

Registration form: (Link)
1 credit2PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler
AbstractThe introductory course on Focused Ion Beam (FIB) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations and hands-on sessions.
Objective- Set-up, align and operate a FIB-SEM successfully and safely.
- Accomplish operation tasks and optimize microscope performances.
- Perform sample preparation (TEM lamella, APT probe…) using FIB-SEM.
- Perform other FIB techniques, such as characterization
- At the end of the course, students will know how to set-up FIB-SEM, how to prepare TEM lamella/APT probe and how to utilize FIB techniques.
ContentThis course provides FIB techniques to students with previous SEM experience.
- Overview of FIB theory, instrumentation, operation and applications.
- Introduction and discussion on FIB and instrumentation.
- Lectures on FIB theory.
- Lectures on FIB applications.
- Practicals on FIB-SEM set-up, cross-beam alignment.
- Practicals on site-specific cross-section and TEM lamellar preparation.
- Lecture and demonstration on FIB automation.
Literature- Detailed course manual.
- Giannuzzi, Stevie: Introduction to focused ion beams instrumentation, theory, techniques, and practice, Springer, 2005.
- Orloff, Utlaut, Swanson: High resolution focused ion beams: FIB and its applications, Kluwer Academic/Plenum Publishers, 2003.
Prerequisites / NoticeThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM Microscopy Training SEM I: Introduction to SEM (327-2125-00L).
- Prior SEM experience.