Stephan Gerstl: Katalogdaten im Frühjahrssemester 2022 |
| Name | Herr Dr. Stephan Gerstl |
| Namensvarianten | Stephan Gerstl SSA Gerstl Stephan S A Gerstl |
| Adresse | ScopeM ETH Zürich, HPM D 47 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telefon | +41 44 633 69 54 |
| stephan.gerstl@scopem.ethz.ch | |
| URL | http://www.scopem.ethz.ch/ |
| Departement | Materialwissenschaft |
| Beziehung | Dozent |
| Nummer | Titel | ECTS | Umfang | Dozierende | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| 327-0413-00L | Materials Characterization II | 4 KP | 4G | R. Erni, S. Gerstl, A. Hrabec, V. Scagnoli, M. Trassin, T. Weber, M. Willinger | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Kurzbeschreibung | Das Hauptlernziel des Kurses ist, dass die Studierenden selbständig eine geeignete Charaktersierungsmethode wählen können, um ein spezifisches materialwissenschaftliches Problem lösen zu können. Folgende Methoden werden dabei behandelt: Licht-, Rasterkraft- und Elektronenmikroskopie, Beugungsmethoden (Röntgen, Neutronen, Elektronen) und Atomsondentomographie. Vorlesungen und Praktika in D oder E. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Lernziel | - Erklären der Grundkonzepte von elementaren und fortgeschrittenen Materialcharakterisierungsmethoden im Bereich der Mikroskopie und Beugung. - Indentifizieren und lösen von praktischen Problemen mittels der Anwendung ausgwählter Chrakterisierungsmethoden basierend auf entsprechenden Labor-Praktika. - Imstande sein, Laien zu beraten warum, wie und wann diese Methoden eingesetzt werden können, um welche Information zu gewinnen und auf mögliche Probleme und Beschränkungen der Messmethoden aufmerksam zu machen. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Inhalt | Im ersten Teil des Semesters werden von verschiedenen Dozenten die Grundlagen von oben erwähnten Materialcharakterisierungsmethoden eingeführt. Dies ist der Vorlesungsteil des Kurses. Im zweiten Teil des Semesters werden die Studierenden, in verschiedenen Gruppen eingeteilt, in drei bis vier Laborpraktika ausgewählte Methoden anwenden. Diese Praktika sind der zentrale Teil dieses Kurses, wo die Studierenden mit praktischen Problemen und den Beschränkungen der einzelnen Methoden konfrontiert werden und selbständig in den Gruppen Lösungen erarbeiten müssen. Speziell: es werden auch Laborpraktika an den Neutronen- und Synchrotron Röntgen Einrichtungen am Paul Scherrer Institut angeboten, die ganztägig nach dem Semesterende stattfinden werden. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Skript | - Folien der Vorlesungen (in Englisch) werden elektronisch verteilt. - Je nach Praktikum, werden zusätzliche Dokumente zur Verfügung gestellt. - In Laborjournalen sind die Studierenden aufgefort ihre eigene Dokumentation der Laborkurse zu verfassen. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Literatur | - B. Fultz, J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed., Springer, 2009. - P. Willmott, An Introduction to Synchrotron Radiation: Techniques and Applications, Wiley, 2011. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Voraussetzungen / Besonderes | Materialcharakterisierung I | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Kompetenzen |
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| 327-2125-00L | Microscopy Training SEM I - Introduction to SEM  Limited number of participants. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee. (http://www.scopem.ethz.ch/education/MTP.html). Registration form: (Link) | 2 KP | 3P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Kurzbeschreibung | Der Einführungskurs in Rasterelektronenmikroskopie (SEM) betont praktisches Lernen. Die Studierenden haben die Möglichkeit an zwei Elektronenmikroskopen ihre eigenen Proben oder Standard-Testproben zu untersuchen, sowie von ScopeM-Wissenschafler vorbereitete Übungen zu lösen. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Lernziel | - Set-up, align and operate a SEM successfully and safely. - Accomplish imaging tasks successfully and optimize microscope performances. - Master the operation of a low-vacuum and field-emission SEM and EDX instrument. - Perform sample preparation with corresponding techniques and equipment for imaging and analysis - Acquire techniques in obtaining secondary electron and backscatter electron micrographs - Perform EDX qualitative and semi-quantitative analysis | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Inhalt | During the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications. This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized. - Discussion of students' sample/interest - Introduction and discussion on Electron Microscopy and instrumentation - Lectures on electron sources, electron lenses and probe formation - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM - Brief description and demonstration of the SEM microscope - Practice on beam/specimen interaction, image formation, image contrast (and image processing) - Student participation on sample preparation techniques - Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities - Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping - Practice on real-world samples and report results | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Voraussetzungen / Besonderes | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| 327-2140-00L | Focused Ion Beam and Applications Number of participants limited to 6. PhD students will be asked for a fee. https://scopem.ethz.ch/education/MTP.html Registration form: (Link) | 1 KP | 2P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Kurzbeschreibung | The introductory course on Focused Ion Beam (FIB) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations and hands-on sessions. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Lernziel | - Set-up, align and operate a FIB-SEM successfully and safely. - Accomplish operation tasks and optimize microscope performances. - Perform sample preparation (TEM lamella, APT probe…) using FIB-SEM. - Perform other FIB techniques, such as characterization - At the end of the course, students will know how to set-up FIB-SEM, how to prepare TEM lamella/APT probe and how to utilize FIB techniques. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Inhalt | This course provides FIB techniques to students with previous SEM experience. - Overview of FIB theory, instrumentation, operation and applications. - Introduction and discussion on FIB and instrumentation. - Lectures on FIB theory. - Lectures on FIB applications. - Practicals on FIB-SEM set-up, cross-beam alignment. - Practicals on site-specific cross-section and TEM lamellar preparation. - Lecture and demonstration on FIB automation. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Literatur | - Detailed course manual. - Giannuzzi, Stevie: Introduction to focused ion beams instrumentation, theory, techniques, and practice, Springer, 2005. - Orloff, Utlaut, Swanson: High resolution focused ion beams: FIB and its applications, Kluwer Academic/Plenum Publishers, 2003. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Voraussetzungen / Besonderes | The students should fulfil one or more of these prerequisites: - Prior attendance to the ScopeM Microscopy Training SEM I: Introduction to SEM (327-2125-00L). - Prior SEM experience. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||