Alla Sologubenko: Katalogdaten im Frühjahrssemester 2020 |
Name | Frau Dr. Alla Sologubenko |
Adresse | ScopeM ETH Zürich, HPM C 57.3 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
Telefon | +41 44 633 68 12 |
alla.sologubenko@scopem.ethz.ch | |
URL | https://scopem.ethz.ch/ |
Departement | Materialwissenschaft |
Beziehung | Dozentin |
Nummer | Titel | ECTS | Umfang | Dozierende | |
---|---|---|---|---|---|
227-0390-00L | Elements of Microscopy | 4 KP | 3G | M. Stampanoni, G. Csúcs, A. Sologubenko | |
Kurzbeschreibung | The lecture reviews the basics of microscopy by discussing wave propagation, diffraction phenomena and aberrations. It gives the basics of light microscopy, introducing fluorescence, wide-field, confocal and multiphoton imaging. It further covers 3D electron microscopy and 3D X-ray tomographic micro and nanoimaging. | ||||
Lernziel | Solid introduction to the basics of microscopy, either with visible light, electrons or X-rays. | ||||
Inhalt | It would be impossible to imagine any scientific activities without the help of microscopy. Nowadays, scientists can count on very powerful instruments that allow investigating sample down to the atomic level. The lecture includes a general introduction to the principles of microscopy, from wave physics to image formation. It provides the physical and engineering basics to understand visible light, electron and X-ray microscopy. During selected exercises in the lab, several sophisticated instrument will be explained and their capabilities demonstrated. | ||||
Literatur | Available Online. | ||||
327-2126-00L | Microscopy Training TEM I - Introduction to TEM Number of participants limited to 6. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee (http://www.scopem.ethz.ch/education/MTP.html). TEM 1 registration form: (Link) | 2 KP | 3P | P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger | |
Kurzbeschreibung | Der Einführungskurs in Transmissionselektronenmikroskopie (TEM) bietet neuen Nutzern die Möglichkeit theoretisches Wissen und praktische Kenntnisse in TEM zu erwerben | ||||
Lernziel | - Overview of TEM theory, instrumentation, operation and applications. - Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully. - Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras. - To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns. - Overview of techniques for specimen preparation. | ||||
Inhalt | Using two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods. - Introduction and discussion on Electron Microscopy and instrumentation. - Lectures on electron sources, electron lenses and probe formation. - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM. - Brief description and demonstration of the TEM microscope. - Practice on beam/specimen interaction, image formation, Image contrast (and image processing). - Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM). - Student participation on sample preparation techniques. - Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities. - TEM alignment, calibration, correction to improve image contrast and quality. - Electron diffraction. - Practice on real-world samples and report results. | ||||
Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
Voraussetzungen / Besonderes | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | ||||
327-2135-00L | Advanced Analytical TEM Number of participants limited to 12. Master students will have priority over PhD students. More information here: https://scopem.ethz.ch/education/MTP.html | 2 KP | 3G | A. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng | |
Kurzbeschreibung | The course focuses on the fundamental understanding and hands-on knowledge of analytical Transmission Electron Microscopy (ATEM) techniques: electron dispersive X-ray analysis (EDX), energy filtered TEM and electron energy loss spectroscopy (EELS). The lectures will be followed by demonstrations and acquisition sessions TEM instruments.The lectures on statistical treatment of raw data sets and on | ||||
Lernziel | • Setting-up the optimal operation conditions for reliable EDX analysis and quantification. • Setting-up the optimal operation conditions for the reliable EFTEM analyses. • Setting-up the optimal operation conditions for the reliable EELS analyses. • EDX data acquisition, on-line analysis and quantification. • EFTEM data acquisition and analysis. • EELS acquisition analyses. | ||||
Inhalt | 1. Fundamentals of analytical TEM. 2. Electron Optics and Instrumentation. Spectrum Imaging. 3. Quantitative X-ray Spectrometry. 4. EELS. 5. EFTEM. 6. Statistical treatment of raw data. 7. EDX. Quantification and data evaluation. 8. Demonstrations on EDX, EELS, and EFTEM data acquisitions. 9. Practical sessions for students with provided specimens. Practical sessions for students with their own specimens. 10. Questions and such: open discussion. 11. Student presentations. | ||||
Literatur | • Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 • Williams, Carter: Transmission Electron Microscopy, Plenum Press, 2nd Edition 2009 • Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscopy, 3rd Edition, Springer, 2011. | ||||
Voraussetzungen / Besonderes | No mandatory prerequisites. Prior attendance to EM Basic lectures (327-0703-00L, 227- 0390-00L) and to the Microscopy Training TEM I - Introduction to TEM course (327-2126- 00L) is recommended. |