Alla Sologubenko: Catalogue data in Spring Semester 2018

Name Dr. Alla Sologubenko
Address
ScopeM
ETH Zürich, HPM C 57.3
Otto-Stern-Weg 3
8093 Zürich
SWITZERLAND
Telephone+41 44 633 68 12
E-mailalla.sologubenko@scopem.ethz.ch
URLhttps://scopem.ethz.ch/
DepartmentMaterials
RelationshipLecturer

NumberTitleECTSHoursLecturers
227-0390-00LElements of Microscopy4 credits3GM. Stampanoni, G. Csúcs, A. Sologubenko
AbstractThe lecture reviews the basics of microscopy by discussing wave propagation, diffraction phenomena and aberrations. It gives the basics of light microscopy, introducing fluorescence, wide-field, confocal and multiphoton imaging. It further covers 3D electron microscopy and 3D X-ray tomographic micro and nanoimaging.
ObjectiveSolid introduction to the basics of microscopy, either with visible light, electrons or X-rays.
ContentIt would be impossible to imagine any scientific activities without the help of microscopy. Nowadays, scientists can count on very powerful instruments that allow investigating sample down to the atomic level.
The lecture includes a general introduction to the principles of microscopy, from wave physics to image formation. It provides the physical and engineering basics to understand visible light, electron and X-ray microscopy.
During selected exercises in the lab, several sophisticated instrument will be explained and their capabilities demonstrated.
LiteratureAvailable Online.
327-2128-00LHigh Resolution Transmission Electron Microscopy Restricted registration - show details 2 credits3GA. Sologubenko, R. Erni, R. Schäublin
AbstractThis advanced course on High Resolution Transmission Electron Microscopy (HRTEM) provides lectures focused on HRTEM and HRSTEM imaging principles, related data analysis and simulation and phase restoration methods.
Objective- Learning how HRTEM and HRSTEM images are obtained.
- Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them.
- Learning about TEM and STEM images simulation software.
- Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).
ContentThis course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them.

Topics:
1. Introduction to HRTEM and HRSTEM
2. Considerations on (S)TEM instrumentation for high resolution imaging
3. Lectures on aberrations, aberration correction and aberration corrected images
4. HRTEM and HRSTEM simulation
5. Data analysis, phase restoration and lattice-strain analysis
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009
- Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016
- Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015.
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM TEM basic course
- Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science)
- Prior TEM experience
327-2135-00LAdvanced Analytical TEM Restricted registration - show details 2 credits3GA. Sologubenko, R. Erni, R. Schäublin
AbstractThe course focuses on the fundamental understanding and hands-on knowledge of analytical Transmission Electron Microscopy (ATEM) techniques: electron dispersive X-ray analysis (EDX), energy filtered TEM and electron energy loss spectroscopy (EELS). The lectures will be followed by demonstrations and acquisition sessions TEM instruments.The lectures on statistical treatment of raw data sets and on
Objective• Setting-up the optimal operation conditions for reliable EDX analysis and quantification.
• Setting-up the optimal operation conditions for the reliable EFTEM analyses.
• Setting-up the optimal operation conditions for the reliable EELS analyses.
• EDX data acquisition, on-line analysis and quantification.
• EFTEM data acquisition and analysis.
• EELS acquisition analyses.
Content1. Fundamentals of analytical TEM.
2. Electron Optics and Instrumentation. Spectrum Imaging.
3. Quantitative X-ray Spectrometry.
4. EELS.
5. EFTEM.
6. Statistical treatment of raw data.
7. EDX. Quantification and data evaluation.
8. Demonstrations on EDX, EELS, and EFTEM data acquisitions.
9. Practical sessions for students with provided specimens. Practical sessions for
students with their own specimens.
10. Questions and such: open discussion.
11. Student presentations.
Literature• Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
• Williams, Carter: Transmission Electron Microscopy, Plenum Press, 2nd Edition 2009
• Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscopy, 3rd Edition,
Springer, 2011.
Prerequisites / NoticeNo mandatory prerequisites. Prior attendance to EM Basic lectures (327-0703-00L, 227- 0390-00L) and to the Microscopy Training TEM I - Introduction to TEM course (327-2126- 00L) is recommended.