Alla Sologubenko: Katalogdaten im Herbstsemester 2019 |
| Name | Frau Dr. Alla Sologubenko |
| Adresse | ScopeM ETH Zürich, HPM C 57.3 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telefon | +41 44 633 68 12 |
| alla.sologubenko@scopem.ethz.ch | |
| URL | https://scopem.ethz.ch/ |
| Departement | Materialwissenschaft |
| Beziehung | Dozentin |
| Nummer | Titel | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|
| 327-2128-00L | High Resolution Transmission Electron Microscopy  Number of participants limited. Students who wish to obtain ECTS points need to participate at additional hands-on sessions at ScopeM and EMPA. A separate registration is necessary: HRTEM registration form (Link) and PhD-Students will be asked for a fee ( ScopeM MTP - http://www.scopem.ethz.ch/education/MTP.html ). | 2 KP | 3G | A. Sologubenko, R. Erni, R. Schäublin | |
| Kurzbeschreibung | Dieser Fortgeschrittenenkurs für hochauflösende Transmissionselektronenmikroskopie (HRTEM) bietet Vorlesungen, die sich auf HRTEM- und HRSTEM-Bildgebungsprinzipien, die zugehörige Datenanalyse und Simulation, sowie Phasenwiederherstellungsmethoden konzentrieren. | ||||
| Lernziel | - Learning how HRTEM and HRSTEM images are obtained. - Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them. - Learning about TEM and STEM images simulation software. - Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions). | ||||
| Inhalt | This course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them. Topics: 1. Introduction to HRTEM and HRSTEM 2. Considerations on (S)TEM instrumentation for high resolution imaging 3. Lectures on aberrations, aberration correction and aberration corrected images 4. HRTEM and HRSTEM simulation 5. Data analysis, phase restoration and lattice-strain analysis | ||||
| Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009 - Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016 - Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015. - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
| Voraussetzungen / Besonderes | The students should fulfil one or more of these prerequisites: - Prior attendance to the ScopeM TEM basic course - Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science) - Prior TEM experience | ||||
| 327-2137-00L | Scattering Techniques for Material Characterization Number of participants limited to 12. D-MATL master students will have priority over all other students. | 3 KP | 2V + 1U | T. Weber, A. Sologubenko | |
| Kurzbeschreibung | The lecture presents the currently most efficient experimental techniques for microstructure material characterization: X-ray diffraction (XRD) and transmission electron microscopy (TEM). The theoretical basics, instrumentation, complementarity and exclusivity of both techniques will be taught. The course includes practical elements and examples of current research projects at D-MATL. | ||||
| Lernziel | Students are able to do: - systematically characterise the microstructure and phases of a given material with X-rays and electrons - select the right tool (source, instrument, measurement strategy) and design a workflow for solving a microstructure or phase analysis problem - describe possibilities and limitations of a given characterisation method - comprehensively store experimentally collected data in a repository following modern data management rules such that data can be evaluated by students not involved in the experiment - qualitatively and quantitatively evaluate and present experimental data and results collected by others | ||||
| Inhalt | The main goal of this praxis-oriented hands-on course is to give the students comprehensive insights into the most important aspects of microstructure characterisation with X-rays and electrons. One focus is on the complementarity and exclusiveness of the two techniques. Another essential facet is to link the course to every-day problems and materials of D-MATL projects: each topic will be introduced as a 5 – 10 min presentation about a related research project given by a D-MATL user of ScopeM or the D-MATL X-ray platform. After such an “appetizer”, we will introduce the topic and the relevant theory more formally, discuss how such problems can be solved with X-rays and electrons, discuss intrinsic and extrinsic advantages and limitations and explain the special requirements regarding instrumentation. | ||||
| Literatur | - Diffraction Analysis of the Microstructure of Materials, E.J. Mittemeijer, P.Scardi, Springer, 2004. - Fundamentals of Powder Diffraction and Structural Characterization of Materials, 2nd ed., V. K. Pecharsky, P. Y. Zavalij, Springer, 2009. - Transmission Electron Microscopy and Diffractometry of Materials, B. Fultz and J.M. Howe, Springer 2001. - Electron Microscopy and Analyses, 3rd ed., P. J. Goodhew, J. Humphreys, R. Beanland, Taylor & Francis 2001. | ||||
| Voraussetzungen / Besonderes | Crystallography, X-ray diffraction and electron microscopy on the BSc level. | ||||