Rolf Erni: Catalogue data in Spring Semester 2023

Name Prof. Dr. Rolf Erni
Überlandstrasse 129
Zentrum für Elektronenmikroskopie
8600 Dübendorf
Telephone058 765 40 80
RelationshipAdjunct Professor

327-0413-00LMaterials Characterization II4 credits4GR. Erni, S. Gerstl, A. Hrabec, S. S. Lee, V. Scagnoli, M. Trassin, T. Weber, P. Zeng
AbstractThe main aim of the course is to enable the students to independently choose a suitable material characterization methods to address a specific materials science question. Subject areas are: light microscopy, diffraction methods (X-rays, neutrons, electrons), electron microscopy, atom probe tomography and atomic force microscopy. Depending on lecturer, lectures and practicals in German or English.
Objective- Being able to explain the fundamentals of basic and advanced materials characterization methods based on microscopy and diffraction modalities.

- Being able to identify and solve practical problems of selected characterization methods based on corresponding laboratory work.

- Being able to advice non-experts why, how and when these methods can be used to assess what type of information, and to draw awareness to possible problems and limitations of these methods.
ContentIn the first part of the semester, different lecturers will present the fundamentals of the materials characterization methods mentioned above. This is the lecture part of the course. In the second half of the semester, the students, grouped in teams, will apply selected methods. These laboratory works are at the heart of the course, where the students are faced with practical problems and the limitations of the different methods, and where they have to independently elaborate solutions within the teams. Special: some practical courses are offered at the Paul Scherrer Institute, where the students can make use of the neutron and synchrotron X-ray facilities. These courses will take place after the end of the semester and occupy half and full days.
Lecture notes- Slides of the lectures (in English) will be distributed electronically.
- Depending on the laboratory course, additional documentation will be made available.
- In laboratory journals, the students are asked to compose their own documentation of the laboratory courses.
Literature- B. Fultz, J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed., Springer, 2009.
- P. Willmott, An Introduction to Synchrotron Radiation: Techniques and Applications, Wiley, 2011.
Prerequisites / NoticeMaterials Characterization I
Subject-specific CompetenciesConcepts and Theoriesassessed
Techniques and Technologiesassessed
Method-specific CompetenciesAnalytical Competenciesfostered
Media and Digital Technologiesfostered
Project Managementfostered
Social CompetenciesCommunicationassessed
Cooperation and Teamworkassessed
Customer Orientationfostered
Leadership and Responsibilityfostered
Self-presentation and Social Influence fostered
Sensitivity to Diversityfostered
Personal CompetenciesAdaptability and Flexibilityfostered
Creative Thinkingassessed
Critical Thinkingassessed
Integrity and Work Ethicsfostered
Self-awareness and Self-reflection fostered
Self-direction and Self-management assessed
327-2128-00LHigh Resolution Transmission Electron Microscopy Restricted registration - show details
Limited number of participants.
More information here: Link

Registration form:
2 credits3GA. Sologubenko, R. Erni, R. Schäublin, P. Zeng
AbstractThis advanced course on High Resolution Transmission Electron Microscopy (HRTEM) provides lectures focused on HRTEM and HRSTEM imaging principles, related data analysis and simulation and phase restoration methods.
Objective- Learning how HRTEM and HRSTEM images are obtained.
- Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them.
- Learning about TEM and STEM images simulation software.
- Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).
ContentThis course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them.

1. Introduction to HRTEM and HRSTEM
2. Considerations on (S)TEM instrumentation for high resolution imaging
3. Lectures on aberrations, aberration correction and aberration corrected images
4. HRTEM and HRSTEM simulation
5. Data analysis, phase restoration and lattice-strain analysis
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009
- Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016
- Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015.
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM TEM basic course
- Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science)
- Prior TEM experience
327-2139-00LDiffraction Physics in Materials Science3 credits3GR. Erni
AbstractThe lecture focuses on diffraction and scattering phenomena in materials science beyond basic Bragg diffraction. Introducing the Born approximation and Kirchhoff’s theory, diffraction from ideal and non-ideal crystals is treated including, e.g., temperature and size effects, ordering phenomena, small-angle scattering and dynamical diffraction theories for both electron and X-ray diffraction.
Objective• To become familiar with advanced diffraction phenomena in order to be able to explore the structure and properties of (solid) matter and their defects.

• To be able to judge what type of diffraction method is suitable to probe what type of materials information.

• To build up a generally applicable and fundamental theoretical understanding of scattering and diffraction effects.

• To be able to identify limitations of the methods and the underlying theory which is commonly used to analyze diffraction data.
ContentThe course provides a general introduction to advanced diffraction phenomena in materials science. The lecture series covers the following topics: derivation of a general scattering theory based on Green’s function as basis for the introduction of the first-order Born approximation; Kirchhoff’s diffraction theory with its integral theorem and the specific cases of Fresnel and Fraunhofer diffraction; diffraction from ideal crystals and diffraction from real crystals considering temperature effects expressed by the temperature Debye-Waller factor and by thermal diffuse scattering, atomic size effects expressed by the static Debye-Waller factor and diffuse scattering due to the modulation of the Laue monotonic scattering as a consequence of local order or clustering; the basics of small-angle scattering; and finally approaches used to treat dynamical diffraction are introduced. In addition, the specifics of X-ray, electron and neutron scattering are being discussed. The course is complemented by a lab visit, selected exercises and short topical presentations given by the participants.
Lecture notesFull-text script is available covering within about 100 pages the core topics of the lecture and all necessary derivations.
Literature- Diffraction Physics, 3rd ed., J. M. Cowley, Elsevier, 1994.

- X-Ray Diffraction, B. E. Warren, Dover, 1990.

- Diffraction from Materials, 2nd ed., L. H. Schwartz, J. B. Cohen, Springer, 1987.

- X-Ray Diffraction – In Crystals, Imperfect Crystals and Amorphous Bodies, A. Guinier, Dover, 1994.

- Aberration-corrected imaging in transmission electron microscopy, 2nd ed., R. Erni, Imperial College Press, 2015.
Prerequisites / NoticeBasics of crystallography and the concept of reciprocal space, basics of electromagnetic and particle waves (but not mandatory)