Rolf Erni: Katalogdaten im Frühjahrssemester 2021

NameHerr Prof. Dr. Rolf Erni
Adresse
Empa
Überlandstrasse 129
Zentrum für Elektronenmikroskopie
8600 Dübendorf
SWITZERLAND
Telefon058 765 40 80
E-Mailrolf.erni@mat.ethz.ch
DepartementMaterialwissenschaft
BeziehungTitularprofessor

NummerTitelECTSUmfangDozierende
327-2128-00LHigh Resolution Transmission Electron Microscopy Belegung eingeschränkt - Details anzeigen
Limited number of participants.
More information here: Link
2 KP3GA. Sologubenko, R. Erni, R. Schäublin, M. Willinger, P. Zeng
KurzbeschreibungDieser Fortgeschrittenenkurs für hochauflösende Transmissionselektronenmikroskopie (HRTEM) bietet Vorlesungen, die sich auf HRTEM- und HRSTEM-Bildgebungsprinzipien, die zugehörige Datenanalyse und Simulation, sowie Phasenwiederherstellungsmethoden konzentrieren.
Lernziel- Learning how HRTEM and HRSTEM images are obtained.
- Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them.
- Learning about TEM and STEM images simulation software.
- Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).
InhaltThis course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them.

Topics:
1. Introduction to HRTEM and HRSTEM
2. Considerations on (S)TEM instrumentation for high resolution imaging
3. Lectures on aberrations, aberration correction and aberration corrected images
4. HRTEM and HRSTEM simulation
5. Data analysis, phase restoration and lattice-strain analysis
Literatur- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009
- Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016
- Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015.
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM TEM basic course
- Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science)
- Prior TEM experience
327-2139-00LDiffraction Physics in Materials Science3 KP3GR. Erni
KurzbeschreibungThe lecture focuses on diffraction and scattering phenomena in materials science beyond basic Bragg diffraction. Introducing the 1st-order Born approximation and Kirchoff’s theory, diffraction from ideal and non-ideal crystals is treated including, e.g., temperature and shape effects, ordering phenomena, small-angle scattering and dynamical diffraction theories.
Lernziel• To become familiar with advanced diffraction phenomena in order to be able to explore the structure and properties of (solid) matter and their defects.
• To build up a generally applicable and fundamental theoretical understanding of scattering and diffraction effects.
• To learn about limitations of the methods and the underlying theory which is commonly used to analyze diffraction data.
InhaltThe course provides a general introduction to advanced diffraction phenomena in materials science. The lecture series covers the following topics: derivation of a general scattering theory based on Green’s function as basis for the introduction of the first-order Born approximation; Kirchhoff’s diffraction theory with its integral theorem and the specific cases of Fresnel and Fraunhofer diffraction; diffraction from ideal crystals and diffraction from real crystals considering temperature effects expressed by the temperature Debye-Waller factor and by thermal diffuse scattering, atomic size effects expressed by the static Debye-Waller factor and diffuse scattering due to the modulation of the Laue monotonic scattering as a consequence of local order or clustering; the basics of small-angle scattering; and finally approaches used to treat dynamical diffraction are introduced and exemplified by performing simulations. In addition, the specifics of X-ray, electron and neutron scattering are being discussed. The course is complemented by a lab visit, live demos, selected exercises and short topical presentations given by the participants.
SkriptFull-text script is available covering within about 100 pages the core topics of the lecture and all necessary derivations.
Literatur- Diffraction Physics, 3rd ed., J. M. Cowley, Elsevier, 1994.
- X-Ray Diffraction, B. E. Warren, Dover, 1990.
- Diffraction from Materials, 2nd ed., L. H. Schwartz, J. B. Cohen, Springer, 1987.
- X-Ray Diffraction – In Crystals, Imperfect Crystals and Amorphous Bodies, A. Guinier, Dover, 1994.
- Aberration-corrected imaging in transmission electron microscopy, 2nd ed., R. Erni, Imperial College Press, 2015.
Voraussetzungen / BesonderesBasics of crystallography and the concept of reciprocal space, basics of electromagnetic and particle waves (but not mandatory)