Laura Heyderman: Catalogue data in Autumn Semester 2019 |
| Name | Prof. Dr. Laura Heyderman |
| Name variants | Laura J. Heyderman Laura Heyderman Laura Jane Heyderman |
| Field | Mesoscopic Systems |
| Address | Professur Mesoskopische Systeme ETH Zürich, HPP P 14.2 Hönggerbergring 64 8093 Zürich SWITZERLAND |
| Telephone | +41 44 633 08 40 |
| laura.heyderman@mat.ethz.ch | |
| Department | Materials |
| Relationship | Full Professor |
| Number | Title | ECTS | Hours | Lecturers | |
|---|---|---|---|---|---|
| 327-0103-00L | Introduction to Materials Science | 3 credits | 3G | M. Niederberger, L. Heyderman, N. Spencer, P. Uggowitzer | |
| Abstract | Fundamental knowledge and understanding of the atomistic and macroscopic concepts of material science. | ||||
| Learning objective | Basic concepts in materials science. | ||||
| Content | Contents: Atomic structure Atomic bonds Crystalline structure, perfection - imperfection Thermodynamics and phase diagrams Diffusion Mechanical properties Electric, magnetic and optical properties of materials Surfaces Materials ageing and failure | ||||
| Literature | James F. Shackelford Introduction to Materials Science for Engineers 5th Ed., Prentice Hall, New Jersey, 2000 | ||||
| 327-0504-00L | Materials Characterisation Methods  | 3 credits | 2V + 1U | L. Heyderman | |
| Abstract | The lecture course is aimed at qualifying the student to choose the optimum characterization method according to the questions posed. The main topics are: Thermal Analysis (TD, TG, TM, DTA, DSC), light microscopy, diffraction methods (XRD, NRD, SAD), electron microscopy (TEM, HRTEM, STEM, HAADF-STEM, SEM, ESEM, EFEM, EDX, EELS). | ||||
| Learning objective | The lecture course is aimed at qualifying the student to choose the optimum characterization method according to the questions posed. | ||||
| Content | Introduction into the fundamentals of materials characterization: Thermal Analysis (TD, TG, TM, DTA, DSC), light microscopy, diffraction methods (XRD, NRD, SAD), electron microscopy (TEM, HRTEM, STEM, HAADF-STEM, SEM, ESEM, EFEM, EDX, EELS). The emphasis is on the discussion of the fundamentals of these characterization methods. | ||||
| Lecture notes | Script is provided. | ||||
| Literature | Materials Science and technology: A comprehensive treatment. ed. by R. W. Cahn, P. Haasen, E.J. Kramer. VCH Weinheim 1992, 1994. Volume 2 Characterization of Materials (Volume Editor E. Lifshin). | ||||