Fabian Gramm: Catalogue data in Autumn Semester 2020 |
| Name | Dr. Fabian Gramm |
| Address | ScopeM ETH Zürich, HPM D 46 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telephone | +41 44 633 39 09 |
| fabian.gramm@scopem.ethz.ch | |
| Department | Materials |
| Relationship | Lecturer |
| Number | Title | ECTS | Hours | Lecturers | |
|---|---|---|---|---|---|
| 327-0702-00L | EM-Practical Course in Materials Science | 2 credits | 4P | K. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler | |
| Abstract | Practical work on TEM, SEM, FIB and APT treatment of typical problems data analysis, writing of a report | ||||
| Learning objective | Application of basic electron microscopic techniques to materials science problems | ||||
| Literature | see lecture Electron Microscopy (327-0703-00L) | ||||
| Prerequisites / Notice | Attendance of lecture Electron Microscopy (327-0703-00L) is recommended. Maximum number of participants 15, work in groups of 3 people. | ||||
| 327-0703-00L | Electron Microscopy in Material Science | 4 credits | 2V + 2U | K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger | |
| Abstract | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
| Learning objective | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
| Content | This course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported. | ||||
| Lecture notes | will be distributed in English | ||||
| Literature | Goodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000 Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014 Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013 Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008 Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015) | ||||
| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM  The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (http://www.scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | 2 credits | 3P | P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger | |
| Abstract | The introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for beginners who are interested in using TEM for their Master or PhD thesis. TEM sample preparation techniques are also discussed. During hands-on sessions at different TEM instruments, students will have the opportunity to examine their own samples if time allows. | ||||
| Learning objective | Understanding of 1. the set-up and individual components of a TEM 2. the basics of electron optics and image formation 3. the basics of electron beam – sample interactions 4. the contrast mechanism 5. various sample preparation techniques Learning how to 1. align and operate a TEM 2. acquire data using different operation modes of a TEM instrument, i.e. Bright-field and Dark-field imaging 3. record electron diffraction patterns and index diffraction patterns 4. interpret TEM data | ||||
| Content | Lectures: - basics of electron optics and the TEM instrument set-up - TEM imaging modes and image contrast - STEM operation mode - Sample preparation techniques for hard and soft materials Practicals: - Demo, practical demonstration of a TEM: instrument components, alignment, etc. - Hands-on training for students: sample loading, instrument alignment and data acquisition. - Sample preparation for different types of materials - Practical work with TEMs - Demonstration of advanced Transmission Electron Microscopy techniques | ||||
| Lecture notes | Lecture notes will be distributed. | ||||
| Literature | - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
| Prerequisites / Notice | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551-1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | ||||