Fabian Gramm: Catalogue data in Autumn Semester 2020

Name Dr. Fabian Gramm
Address
ScopeM
ETH Zürich, HPM D 46
Otto-Stern-Weg 3
8093 Zürich
SWITZERLAND
Telephone+41 44 633 39 09
E-mailfabian.gramm@scopem.ethz.ch
DepartmentMaterials
RelationshipLecturer

NumberTitleECTSHoursLecturers
327-0702-00LEM-Practical Course in Materials Science2 credits4PK. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler
AbstractPractical work on TEM, SEM, FIB and APT
treatment of typical problems
data analysis, writing of a report
ObjectiveApplication of basic electron microscopic techniques to materials science problems
Literaturesee lecture Electron Microscopy (327-0703-00L)
Prerequisites / NoticeAttendance of lecture Electron Microscopy (327-0703-00L) is recommended.
Maximum number of participants 15, work in groups of 3 people.
327-0703-00LElectron Microscopy in Material Science4 credits2V + 2UK. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger
AbstractA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
ObjectiveA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
ContentThis course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported.
Lecture noteswill be distributed in English
LiteratureGoodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000
Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014
Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013
Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008
Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015)
327-2126-00LMicroscopy Training TEM I - Introduction to TEM Restricted registration - show details
The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list.

For PhD students, postdocs and others, a fee will be charged (Link).

All applicants must additionally register on this form: Link
The selected applicants will be contacted and asked for confirmation a few weeks before the course date.
2 credits3PP. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger
AbstractThe introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for beginners who are interested in using TEM for their Master or PhD thesis. TEM sample preparation techniques are also discussed. During hands-on sessions at different TEM instruments, students will have the opportunity to examine their own samples if time allows.
ObjectiveUnderstanding of
1. the set-up and individual components of a TEM
2. the basics of electron optics and image formation
3. the basics of electron beam – sample interactions
4. the contrast mechanism
5. various sample preparation techniques
Learning how to
1. align and operate a TEM
2. acquire data using different operation modes of a TEM instrument, i.e. Bright-field and Dark-field imaging
3. record electron diffraction patterns and index diffraction patterns
4. interpret TEM data
ContentLectures:
- basics of electron optics and the TEM instrument set-up
- TEM imaging modes and image contrast
- STEM operation mode
- Sample preparation techniques for hard and soft materials

Practicals:
- Demo, practical demonstration of a TEM: instrument components, alignment, etc.
- Hands-on training for students: sample loading, instrument alignment and data acquisition.
- Sample preparation for different types of materials
- Practical work with TEMs
- Demonstration of advanced Transmission Electron Microscopy techniques
Lecture notesLecture notes will be distributed.
Literature- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551-1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.