Maarten Nachtegaal: Catalogue data in Spring Semester 2019

Name Dr. Maarten Nachtegaal
E-mailmaarten.nachtegaal@usys.ethz.ch
DepartmentEnvironmental Systems Science
RelationshipLecturer

NumberTitleECTSHoursLecturers
529-0135-00LCook and Look: Watching Functional Materials in Situ3 credits3GM. Nachtegaal, D. Ferri, O. Safonova, T. Schmidt
AbstractHands-on course on in situ spectroscopies (x-ray, infrared, Raman) and x-ray diffraction for understanding the structure of functional materials.
ObjectiveThorough understanding of available state-of-the-art spectroscopies for the characterization of the structure of functional materials under in situ conditions.
Problem solving strategies and reporting in a scientific format.
To learn the basics of spectroscopic data analysis.
ContentThis course will introduce state-of-the art synchrotron techniques (x-ray absorption and emission spectroscopies, x-ray diffraction) as well as complementary infrared and Raman spectroscopies for the characterization of functional materials, such as catalysts, under operating (in situ) conditions. On the ‘cook’ days, each technique will be introduced by a lecture, after which samples will be ‘cooked’ (sample preparation, building in situ setup, and measurement). This will be followed by a ‘look’ day where the collected data will be analyzed. Principles of x-ray data treatment, including Fourier transformation, will be introduced.
Lecture notesA course manual with in depth background information will be distributed before the course.
LiteratureWill be suggested in the course manual and made available during the course.
Prerequisites / NoticeThe course will take place at the Swiss Light Source, at the Paul Scherrer Institut. Students will be housed for several nights in the guest house. You are required to contact the organizers upon registration since beamtime and housing has to be reserved well in advance.
701-1336-00LCook and Look: Synchroton Techniques3 credits6PM. Nachtegaal, C. Borca, M. Janousch
AbstractAtomic-scale structure elucidation of trace metal complexes by synchrotron-based X-ray diffraction, X-ray absorption spectroscopy and X-ray fluorescence. Basics of spectroscopy and diffraction.
ObjectiveTo get a thorough understanding of available state-of-the-art synchrotron-based techniques for the analysis of biogeochemical samples.
To learn the basics of spectroscopic data analysis.
Problem solving strategies and reporting in a scientific format.
ContentThis course will introduce state-of-the art synchrotron (at the Swiss Light Source) based techniques (X-ray diffraction, X-ray absorption spectroscopy and X-ray tomography) for the analysis of trace elements in biogeochemical systems. On the ‘cook’ day, each synchrotron technique will be introduced by a lecture, after which samples will be ‘cooked’ (prepared and mounted in the experimental station). This will be followed by the ‘look’ day where the collected data will be analyzed.
Lecture notesCook and Look course manual will be distributed before the course.
Prerequisites / NoticeThe course language is english. The course will take place at the Swiss Light Source, located at the Paul Scherrer Institut. Students will be housed for several nights in the guest house.
You are required to contact the organizers upon registration, since beamtime and housing has to be reserved well in advance.