Frank Krumeich: Katalogdaten im Herbstsemester 2020 |
| Name | Herr Dr. Frank Krumeich |
| Adresse | Anorganische Funktionsmaterialien ETH Zürich, HCI H 109 Vladimir-Prelog-Weg 1-5/10 8093 Zürich SWITZERLAND |
| Telefon | +41 44 633 41 53 |
| krumeich@inorg.chem.ethz.ch | |
| URL | http://www.microscopy.ethz.ch |
| Departement | Materialwissenschaft |
| Beziehung | Dozent |
| Nummer | Titel | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|
| 327-0702-00L | EM-Practical Course in Materials Science | 2 KP | 4P | K. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler | |
| Kurzbeschreibung | Praktische Arbeit an TEM, SEM, FIB und APT selbständiges Bearbeiten von typischen Fragestellungen Auswertung der Daten, Schreiben eines Reports | ||||
| Lernziel | Anwendung grundlegender elektronenmikroskopischer Techniken im Bereich materialwissenschaftlicher Fragestellungen | ||||
| Literatur | siehe LE Electron Microscopy (327-0703-00L) | ||||
| Voraussetzungen / Besonderes | Besuch der LE Electron Microscopy (327-0703-00L) wird empfohlen. Maximale Teilnehmerzahl 15, Arbeit in 3-er Gruppen. | ||||
| 327-0703-00L | Electron Microscopy in Material Science | 4 KP | 2V + 2U | K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger | |
| Kurzbeschreibung | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
| Lernziel | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
| Inhalt | This course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported. | ||||
| Skript | will be distributed in English | ||||
| Literatur | Goodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000 Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014 Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013 Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008 Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015) | ||||