Frank Krumeich: Catalogue data in Autumn Semester 2020

Name Dr. Frank Krumeich
Address
Anorganische Funktionsmaterialien
ETH Zürich, HCI H 109
Vladimir-Prelog-Weg 1-5/10
8093 Zürich
SWITZERLAND
Telephone+41 44 633 41 53
E-mailkrumeich@inorg.chem.ethz.ch
URLhttp://www.microscopy.ethz.ch
DepartmentMaterials
RelationshipLecturer

NumberTitleECTSHoursLecturers
327-0702-00LEM-Practical Course in Materials Science2 credits4PK. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler
AbstractPractical work on TEM, SEM, FIB and APT
treatment of typical problems
data analysis, writing of a report
Learning objectiveApplication of basic electron microscopic techniques to materials science problems
Literaturesee lecture Electron Microscopy (327-0703-00L)
Prerequisites / NoticeAttendance of lecture Electron Microscopy (327-0703-00L) is recommended.
Maximum number of participants 15, work in groups of 3 people.
327-0703-00LElectron Microscopy in Material Science4 credits2V + 2UK. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger
AbstractA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
Learning objectiveA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
ContentThis course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported.
Lecture noteswill be distributed in English
LiteratureGoodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000
Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014
Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013
Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008
Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015)