Nummer | Titel | ECTS | Umfang | Dozierende |
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227-0377-00L | Physics of Failure and Failure Analysis of Electronic Devices and Equipment | 3 KP | 2V | U. Sennhauser |
Kurzbeschreibung | Failures have to be avoided by proper design, material selection and manufacturing. Properties, degradation mechanisms, and expected lifetime of materials are introduced and the basics of failure analysis and analysis equipment are presented. Failures will be demonstrated experimentally and the opportunity is offered to perform a failure analysis with advanced equipment in the laboratory. |
Lernziel | Introduction to the degradation and failure mechanisms and causes of electronic components, devices and systems as well as to methods and tools of reliability testing, characterization and failure analysis. |
Inhalt | Summary of reliability and failure analysis terminology; physics of failure: materials properties, physical processes and failure mechanisms; failure analysis of ICs, PCBs, opto-electronics, discrete and other components and devices; basics and properties of instruments; application in circuit design and reliability analysis |
Skript | Comprehensive copy of transparencies |