Eszter Judit Barthazy Meier: Catalogue data in Autumn Semester 2020 |
| Name | Dr. Eszter Judit Barthazy Meier |
| Address | ScopeM ETH Zürich, HPM C 57.2 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telephone | +41 44 633 20 98 |
| eszter.barthazy@scopem.ethz.ch | |
| URL | https://scopem.ethz.ch/center/people/person-detail.esba.html |
| Department | Materials |
| Relationship | Lecturer |
| Number | Title | ECTS | Hours | Lecturers | |
|---|---|---|---|---|---|
| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM  The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (http://www.scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | 2 credits | 3P | P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko, M. Willinger | |
| Abstract | The introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for beginners who are interested in using TEM for their Master or PhD thesis. TEM sample preparation techniques are also discussed. During hands-on sessions at different TEM instruments, students will have the opportunity to examine their own samples if time allows. | ||||
| Learning objective | Understanding of 1. the set-up and individual components of a TEM 2. the basics of electron optics and image formation 3. the basics of electron beam – sample interactions 4. the contrast mechanism 5. various sample preparation techniques Learning how to 1. align and operate a TEM 2. acquire data using different operation modes of a TEM instrument, i.e. Bright-field and Dark-field imaging 3. record electron diffraction patterns and index diffraction patterns 4. interpret TEM data | ||||
| Content | Lectures: - basics of electron optics and the TEM instrument set-up - TEM imaging modes and image contrast - STEM operation mode - Sample preparation techniques for hard and soft materials Practicals: - Demo, practical demonstration of a TEM: instrument components, alignment, etc. - Hands-on training for students: sample loading, instrument alignment and data acquisition. - Sample preparation for different types of materials - Practical work with TEMs - Demonstration of advanced Transmission Electron Microscopy techniques | ||||
| Lecture notes | Lecture notes will be distributed. | ||||
| Literature | - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
| Prerequisites / Notice | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551-1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | ||||