Karsten Kunze: Catalogue data in Autumn Semester 2020 |
Name | Dr. Karsten Kunze |
Address | ScopeM ETH Zürich, HPM D 46 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
Telephone | +41 44 632 56 95 |
karsten.kunze@scopem.ethz.ch | |
Department | Earth Sciences |
Relationship | Lecturer |
Number | Title | ECTS | Hours | Lecturers | |
---|---|---|---|---|---|
327-0702-00L | EM-Practical Course in Materials Science | 2 credits | 4P | K. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler | |
Abstract | Practical work on TEM, SEM, FIB and APT treatment of typical problems data analysis, writing of a report | ||||
Objective | Application of basic electron microscopic techniques to materials science problems | ||||
Literature | see lecture Electron Microscopy (327-0703-00L) | ||||
Prerequisites / Notice | Attendance of lecture Electron Microscopy (327-0703-00L) is recommended. Maximum number of participants 15, work in groups of 3 people. | ||||
327-0703-00L | Electron Microscopy in Material Science | 4 credits | 2V + 2U | K. Kunze, R. Erni, S. Gerstl, F. Gramm, A. Käch, F. Krumeich, M. Willinger | |
Abstract | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
Objective | A comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials. | ||||
Content | This course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported. | ||||
Lecture notes | will be distributed in English | ||||
Literature | Goodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000 Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014 Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013 Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008 Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015) | ||||
327-2125-00L | Microscopy Training SEM I - Introduction to SEM The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (Link). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | 2 credits | 3P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler | |
Abstract | This introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using ScopeM SEMs, students have the opportunity to study their own samples (or samples provided) and solve practical problems by applying knowledge acquired during the lectures. At the end of the course, students will be able to apply SEM for their (future) research projects. | ||||
Objective | - Set-up, align and operate a SEM successfully and safely. - Understand important operational parameters of SEM and optimize microscope performance. - Explain different signals in SEM and obtain secondary electron (SE) and backscatter electron (BSE) images. - Operate the SEM in low-vacuum mode. - Make use of EDX for semi-quantitative elemental analysis. - Prepare samples with different techniques and equipment for imaging and analysis by SEM. | ||||
Content | During the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications. This course gives basic skills for students new to SEM. At the end of the course, students are able to align an SEM, to obtain secondary electron (SE) and backscatter electron (BSE) images and to perform energy dispersive X-ray spectroscopy (EDX) semi-quantitative analysis. Emphasis is put on procedures to optimize SEM parameters in order to best solve practical problems and deal with a wide range of materials. Lectures: - Introduction on Electron Microscopy and instrumentation - electron sources, electron lenses and probe formation - beam/specimen interaction, image formation, image contrast and imaging modes. - sample preparation techniques for EM - X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescan and spectral mapping Practicals: - Brief description and demonstration of the SEM microscope - Practice on image formation, image contrast (and image processing) - Student participation on sample preparation techniques - Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities - Practice on real-world samples and report results | ||||
Lecture notes | Lecture notes will be distributed. | ||||
Literature | - Peter Goodhew, John Humphreys, Richard Beanland: Electron Microscopy and Analysis, 3rd ed., CRC Press, 2000 - Joseph Goldstein, et al, Scanning Electron Microscopy and X-Ray Microanalysis, 4th ed, Srpinger US, 2018 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
Prerequisites / Notice | No mandatory prerequisites. | ||||
327-2129-00L | Analytical Electron Microscopy | 1 credit | 2P | P. Zeng, L. Grafulha Morales, K. Kunze, A. Sologubenko | |
Abstract | The main goal of this hands-on course is to provide students with fundamental understanding of underlying physical processes, experimental set-up solutions and hands-on practical experience of analytical electron microscopy (AEM) technique for microstructure characterisation, specifically Energy Dispersive X-ray Spectroscopy (EDS) and spectrum imaging (SI) technique. | ||||
Objective | - understanding of physical processes that enable the EDS technique and data evaluation algorithms; - hand-on experience of data acquisition and evaluation routines including o practical understanding of different data acquisition set-ups, o optimization of acquisition parameters for most reliable quantification of the results, o the knowledge of the available and most reliable quantification algorithms and their handling o the knowledge of data evaluation routines and possible handicaps for reliable elemental content distribution analyses and material composition quantification o the effect of the specimen geometry on the data and experimental solutions for minimization of the artefacts | ||||
Content | This advanced course provides analytical EM techniques to the students with prior EM experience (TEM or SEM). At the end of the course, students will understand the physical processes that enable the EDS technique and data evaluation algorithms and apply the technique for their own research. - Introduction to analytical electron microscopy: theory and instrumentation. - Lectures on EDS, WDS - Practical on EDS-SEM: data acquisition and analysis. - Practical on EDS-TEM: data acquisition and analysis. The hand-on trainings are to be carried-out on a real-life specimen, provided by lecturers and / by students. | ||||
Lecture notes | Provided in the course Moodle-page | ||||
Literature | - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM. Springer Verlag, 2007 - Williams & Carter: Transmission Electron Microscopy: A Textbook for Material Sciences. Plenum Press, 2nd Edition 2009, ISBD: 0 306 45247-2 - Goodhew, Humphreys & Beanland: Electron Microscopy and Analyses, Third edition. CRC Press, 2000 - Carter & Williams: Transmission Electron Microscopy: Diffraction, Imaging and Spectrometry. Springer Verlag, 2016, DOI: 10.1007/978-3-319-26651-0 - Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press, 2010 | ||||
Prerequisites / Notice | - Master student or PhD student who has experience with EM (SEM or TEM) techniques or prior attendance of one of the following courses: Microscopy Training SEM1 (327-2125-00L) or Microscopy Training TEM1(327-2126-00L) - Attendance of the following courses is of advantage, but not required: Scattering Techniques for Material Characterization (327-2137-00L) or Elements of Microscopy (227-0390-00L) or Electron Microscopy in Material Science (327-0703-00L) | ||||
651-1851-00L | Introduction to Scanning Electron Microscopy | 1 credit | 2G | L. Grafulha Morales, J. Allaz, K. Kunze | |
Abstract | Introduction to Scanning Electron Microscopy and Microanalysis including Practical training. | ||||
Objective | Introduction in scanning electron microscopy and microanalysis. Obtain practical experience in operating a SEM. | ||||
Content | Functional principles and operation modes of a scanning electron microscope. Methods and application fields for - imaging (SE, BSE, FSE, AE, CL), - X-ray spectroscopy (EDX) - Electron diffraction (EBSD, Channeling, Orientation Imaging). Methods for sample preparation Practical exercises. | ||||
Lecture notes | Scripts and operation manuals are provided during the course. | ||||
Literature | - Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996). - Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994). - Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973). - Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981). | ||||
Prerequisites / Notice | Full day block course after the end of HS |